Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7541202 | Connection device and test system | Susumu Kasukabe, Terutaka Mori, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono | 2009-06-02 |
| 7285430 | Connection device and test system | Susumu Kasukabe, Terutaka Mori, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono | 2007-10-23 |
| 7198962 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Yuji Wada, Naoto Ban +7 more | 2007-04-03 |
| 7119362 | Method of manufacturing semiconductor apparatus | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2006-10-10 |
| 6759258 | Connection device and test system | Susumu Kasukabe, Terutaka Mori, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono | 2004-07-06 |
| 6573112 | Semiconductor device manufacturing method | Ryuji Kono, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more | 2003-06-03 |
| 6566150 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Yuji Wada, Naoto Ban +7 more | 2003-05-20 |
| 6566149 | Method for manufacturing substrate for inspecting semiconductor device | Masatoshi Kanamaru, Atsushi Hosogane, Yoshihige Endou, Ryuji Kouno, Hideo Miura +4 more | 2003-05-20 |
| 6531327 | Method for manufacturing semiconductor device utilizing semiconductor testing equipment | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Ryuji Kohno +1 more | 2003-03-11 |
| 6511857 | Process for manufacturing semiconductor device | Ryuji Kono, Makoto Kitano, Hideo Miura, Hiroyuki Ota, Yoshishige Endo +5 more | 2003-01-28 |
| 6507204 | Semiconductor testing equipment with probe formed on a cantilever of a substrate | Masatoshi Kanamaru, Yoshishige Endo, Atsushi Hosogane, Tatsuya Nagata, Ryuji Kohno +1 more | 2003-01-14 |
| 6479305 | Semiconductor device manufacturing method | Ryuji Kono, Hideyuki Aoki, Hiroyuki Ohta, Yoshishige Endo, Masatoshi Kanamaru +4 more | 2002-11-12 |
| 6455335 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Yuji Wada, Naoto Ban +7 more | 2002-09-24 |
| 6305230 | Connector and probing system | Susumu Kasukabe, Terutaka Mori, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono | 2001-10-23 |
| 6197603 | Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step | Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Yuji Wada, Naoto Ban +7 more | 2001-03-06 |