TM

Terutaka Mori

HI Hitachi: 7 patents #5,859 of 28,497Top 25%
RT Renesas Technology: 4 patents #758 of 3,337Top 25%
Overall (All Time): #468,954 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
7541202 Connection device and test system Susumu Kasukabe, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono 2009-06-02
7390732 Method for producing a semiconductor device with pyramidal bump electrodes bonded onto pad electrodes arranged on a semiconductor chip Takayoshi Watanabe, Hidetaka Shigi, Susumu Kasukabe 2008-06-24
7351597 Fabrication method of semiconductor integrated circuit device Yuji Wada, Susumu Kasukabe, Takehiko Hasebe, Yasunori Narizuka, Akira Yabushita +4 more 2008-04-01
7285430 Connection device and test system Susumu Kasukabe, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono 2007-10-23
7219422 Fabrication method of semiconductor integrated circuit device Yuji Wada, Susumu Kasukabe, Takehiko Hasebe, Yasunori Narizuka, Akira Yabushita +4 more 2007-05-22
7198962 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more 2007-04-03
6759258 Connection device and test system Susumu Kasukabe, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono 2004-07-06
6566150 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more 2003-05-20
6455335 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more 2002-09-24
6305230 Connector and probing system Susumu Kasukabe, Akihiko Ariga, Hidetaka Shigi, Takayoshi Watanabe, Ryuji Kono 2001-10-23
6197603 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Ryuji Kohno, Tetsuo Kumazawa, Makoto Kitano, Akihiko Ariga, Yuji Wada +7 more 2001-03-06