Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8362614 | Fine pitch grid array type semiconductor device | Mitsuaki Katagiri, Fumiyuki Osanai, Yasushi Takahashi, Seiji Narui | 2013-01-29 |
| 7823096 | Inductance analysis system and method and program therefor | Mitsuaki Katagiri, Takashi Iida, Satoshi Isa | 2010-10-26 |
| 7681154 | Method for designing device, system for aiding to design device, and computer program product therefor | Mitsuaki Katagiri, Satoshi Nakamura, Takashi Suga, Satoshi Isa, Satoshi Itaya +1 more | 2010-03-16 |
| 7345892 | Semiconductor device, noise reduction method, and shield cover | Masaharu Imazato, Atsushi Nakamura, Takayuki Watanabe, Kensuke Tsuneda, Mitsuaki Katagiri +1 more | 2008-03-18 |
| 7119446 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2006-10-10 |
| 7030478 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2006-04-18 |
| 6977514 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Toshio Miyatake, Hideo Miura | 2005-12-20 |
| 6955870 | Method of manufacturing a semiconductor device | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hideyuki Aoki | 2005-10-18 |
| 6952110 | Testing apparatus for carrying out inspection of a semiconductor device | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Hideyuki Aoki | 2005-10-04 |
| 6885208 | Semiconductor device and test device for same | Toshio Miyatake, Tatsuya Nagata, Ryuji Kohno, Hideyuki Aoki | 2005-04-26 |
| 6882039 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2005-04-19 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2005-03-08 |
| 6864695 | Semiconductor device testing apparatus and semiconductor device manufacturing method using it | Ryuji Kohno, Hideo Miura, Masatoshi Kanamaru, Naoto Ban | 2005-03-08 |
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanori Aono, Ryuji Kohno, Naoto Ban +1 more | 2004-12-07 |
| 6784533 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2004-08-31 |
| 6614246 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Toshio Miyatake, Hideo Miura | 2003-09-02 |
| 6531785 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2003-03-11 |
| 6465264 | Method for producing semiconductor device and apparatus usable therein | Ryuji Kohno, Masatoshi Kanamaru, Atsushi Hosogane, Toshio Miyatake, Hideo Miura +4 more | 2002-10-15 |
| 6326699 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2001-12-04 |
| 6211576 | Semiconductor device | Asao Nishimura, Tosiho Miyamoto, Hideki Tanaka, Hideo Miura | 2001-04-03 |
| 5838549 | Memory module and an IC card | Tatsuya Nagata, Atsushi Nakamura, Hideshi Fukumoto, Toshio Sugano | 1998-11-17 |