Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11391871 | Manufacturing method of concave diffraction grating, concave diffraction grating, and analyzer using the same | Kenta YAEGASHI, Yoshisada Ebata | 2022-07-19 |
| 11366255 | Concave diffraction grating, method for producing the same, and optical device | Yoshisada Ebata, Kenta YAEGASHI, Shigeru Matsui | 2022-06-21 |
| 10334213 | Scanning image display device | Ayano OTSUBO, Hiroshi Ogasawara, Tatsuya Yamasaki, Kenji Watabe | 2019-06-25 |
| 10098215 | X-ray tube predictive fault indicator sensing device, X-ray tube predictive fault indicator sensing method, and X-ray imaging device | Takashi Nakahara, Shinya Yuda, Tetsu Inahara, Yoshitaka Seki, Kouji Akita +1 more | 2018-10-09 |
| 10082456 | Photothermal conversion spectroscopic analyzer | Jiro Hashizume, Kei Takenaka | 2018-09-25 |
| 9945993 | Curved grating, method for manufacturing the same, and optical device | Yoshisada Ebata, Shigeru Matsui, Tetsuya Watanabe | 2018-04-17 |
| 9709714 | Curved face diffraction grating fabrication method, curved face diffraction grating cast, and curved face diffraction grating employing same | Yoshisada Ebata, Shigeru Matsui, Tetsuya Watanabe, Yugo Onoda | 2017-07-18 |
| 9651408 | Structure of physical sensor | Masatoshi Kanamaru, Masahide Hayashi, Heewon Jeong | 2017-05-16 |
| 9249011 | Process for fabricating MEMS device | Masatoshi Kanamaru, Kengo Suzuki | 2016-02-02 |
| 9146253 | Combined sensor and method for manufacturing the same | Kengo Suzuki, Akira Koide, Masahide Hayashi | 2015-09-29 |
| 8474318 | Acceleration sensor | Atsushi Kazama, Masakatsu Saitoh, Ryoji Okada | 2013-07-02 |
| 8438718 | Manufacturing method of combined sensor | Kengo Suzuki, Akira Koide, Masahide Hayashi | 2013-05-14 |
| 8022433 | Semiconductor sensor device and method for manufacturing same | Ryoji Okada, Atsushi Kazama, Yoshiaki Takada | 2011-09-20 |
| 7969067 | Ultrasound probe | Tatsuya Nagata, Katsunori Asafusa, Takashi Kobayashi, Naoya Kanda | 2011-06-28 |
| 7939938 | Functional device package with metallization arrangement for improved bondability of two substrates | Shohei Hata, Naoki Matsushima, Eiji Sakamoto, Ryoji Okada, Atsushi Kazama +1 more | 2011-05-10 |
| 7667374 | Ultrasonic transducer, ultrasonic probe and method for fabricating the same | Tatsuya Nagata, Hiroyuki Enomoto, Shuntaro Machida | 2010-02-23 |
| 7595099 | Method of producing anisotropic optical element | Masanori Umeya, Hiroyuki Nishimura, Takuya Yamazaki | 2009-09-29 |
| 7018857 | Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe | Masatoshi Kanamaru, Tatsuya Nagata, Kenji Kawakami, Hideyuki Aoki | 2006-03-28 |
| 6828810 | Semiconductor device testing apparatus and method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Ryuji Kohno, Hiroya Shimizu, Naoto Ban +1 more | 2004-12-07 |
| 6660541 | Semiconductor device and a manufacturing method thereof | Masatoshi Kanamaru, Yoshishige Endo, Ryuji Kohno, Hideyuki Aoki | 2003-12-09 |
| 6162356 | Chip for use in nucleic acid separation, structural element and process for forming the structural element | Yukiko Ikeda, Yoshishige Endo, Yasuhiro Yoshimura, Takao Terayama, Kenji Yasuda +2 more | 2000-12-19 |