| 7432628 |
Generator and method of manufacturing same |
Juichi Enyama |
2008-10-07 |
| 6977514 |
Probe structure |
Ryuji Kohno, Tatsuya Nagata, Hiroya Shimizu, Hideo Miura |
2005-12-20 |
| 6885208 |
Semiconductor device and test device for same |
Tatsuya Nagata, Hiroya Shimizu, Ryuji Kohno, Hideyuki Aoki |
2005-04-26 |
| 6864568 |
Packaging device for holding a plurality of semiconductor devices to be inspected |
Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Hideo Miura +4 more |
2005-03-08 |
| 6774654 |
Semiconductor-device inspecting apparatus and a method for manufacturing the same |
Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Hideyuki Aoki +1 more |
2004-08-10 |
| 6614246 |
Probe structure |
Ryuji Kohno, Tatsuya Nagata, Hiroya Shimizu, Hideo Miura |
2003-09-02 |
| 6496023 |
Semiconductor-device inspecting apparatus and a method for manufacturing the same |
Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Hideyuki Aoki +1 more |
2002-12-17 |
| 6465264 |
Method for producing semiconductor device and apparatus usable therein |
Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Hideo Miura +4 more |
2002-10-15 |