Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7356742 | Method and apparatus for testing a memory device in quasi-operating conditions | Hideyuki Aoki, Takeshi Wada, Masaaki Namba, Noboru Uchida, Yuji Wada +1 more | 2008-04-08 |