Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8074293 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Yasuhiro Mitsui, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato +2 more | 2011-12-06 |
| 7553334 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Yasuhiro Mitsui, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato +2 more | 2009-06-30 |
| 7297945 | Defective product inspection apparatus, probe positioning method and probe moving method | Eiichi Hazaki, Yasuhiro Mitsui, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato +2 more | 2007-11-20 |
| 7271385 | Inspection method and inspection apparatus using electron beam | Yasuhiro Gunji, Taku Ninomiya, Ryuichi Funatsu, Kenjirou Yamamoto, Mari Nozoe | 2007-09-18 |
| 7129727 | Defect inspecting apparatus | Tsutomu Saito, Osamu Yamada, Eiichi Hazaki, Yasuhiko Nara, Hirofumi Sato +1 more | 2006-10-31 |
| 6995205 | Resin composition with high thermal conductivity and method of producing the same | Kiyotaka Matsukawa, Kozo Ishihara, Tsuneo Kamiyahata, Yasuyuki Agari, Masayuki Shimada | 2006-02-07 |