Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8638026 | Stage drive device | Masashi Shibahara, Mikio Tokuyama, Koichiro Takeuchi, Shigeru Haneda, Osamu Yamada +2 more | 2014-01-28 |
| 8074293 | Defective product inspection apparatus, probe positioning method and probe moving method | Yasuhiro Mitsui, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato, Osamu Satou +2 more | 2011-12-06 |
| 7598755 | Probe navigation method and device and defect inspection device | Takashi Furukawa, Takayuki Mizuno, Hirofumi Sato | 2009-10-06 |
| 7553334 | Defective product inspection apparatus, probe positioning method and probe moving method | Yasuhiro Mitsui, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato, Osamu Satou +2 more | 2009-06-30 |
| 7372283 | Probe navigation method and device and defect inspection device | Takashi Furukawa, Takayuki Mizuno, Hirofumi Sato | 2008-05-13 |
| 7297945 | Defective product inspection apparatus, probe positioning method and probe moving method | Yasuhiro Mitsui, Takashi Furukawa, Hiroshi Yanagita, Susumu Kato, Osamu Satou +2 more | 2007-11-20 |
| 7129727 | Defect inspecting apparatus | Tsutomu Saito, Osamu Yamada, Yasuhiko Nara, Hirofumi Sato, Yoshikazu Inada +1 more | 2006-10-31 |
| 7071713 | Probe navigation method and device and defect inspection device | Takashi Furukawa, Takayuki Mizuno, Hirofumi Sato | 2006-07-04 |
| 7015483 | Focused ion beam system | Wataru Suzuki | 2006-03-21 |
| 6403968 | Scanning electron microscope | Masaki Kurihara, Kaname Takahashi | 2002-06-11 |
| 5393977 | Charged particle beam apparatus and it's operating method | Akimitsu Okura, Mitsugu Sato, Osamu Yamada, Yasushi Nakaizumi | 1995-02-28 |
| 5384507 | Method of and device for driving piezo-electric elements and system for controlling micromotion mechanism | Ryuji Takada | 1995-01-24 |
| 5256876 | Scanning tunnel microscope equipped with scanning electron microscope | Osamu Yamada, Yasushi Nakaizumi, Shigeyuki Hosoki, Sumio Hosaka, Akira Hashimoto | 1993-10-26 |
| 5081353 | Combined scanning electron and scanning tunnelling microscope apparatus and method | Osamu Yamada, Yasushi Nakaizumi | 1992-01-14 |
| 5026995 | Particle beam surface analyzer | Tadashi Otaka, Minoru Shimizu | 1991-06-25 |
| RE33473 | Oil feeding device for scroll fluid apparatus | Masaya Imai, Kenji Tojo, Masao Shiibayashi | 1990-12-04 |
| RE33236 | Bearing device of sealed type scroll compressor | Hiroaki Kuno, Naoshi Uchikawa, Takahiro Tamura, Akira Murayama, Takao Mizuno | 1990-06-19 |
| 4749344 | Oil feeding device for scroll fluid apparatus | Yoshikatsu Tomita, Katsuaki Kikuchi, Tetsuya Arata, Masao Shiibayashi, Kazutaka Suefuji +2 more | 1988-06-07 |
| 4639146 | Thrust bearing | Masahiro Yoshioka, Hideki Izumi, Hiroshi Inouye, Shiro Nakadaira | 1987-01-27 |
| 4555224 | Oil feeding device for scroll fluid apparatus | Masaya Imai, Kenji Tojo, Masao Shiibayashi | 1985-11-26 |
| 4551082 | Bearing device of sealed type scroll compressor | Hiroaki Kuno, Naoshi Uchikawa, Takahiro Tamura, Akira Murayama, Takao Mizuno | 1985-11-05 |
| 4502852 | Oil feeding device for scroll fluid apparatus | — | 1985-03-05 |
| 4473343 | Bearing device for scroll-type compressor | Kenji Tojo, Naoshi Uchikawa, Akira Murayama | 1984-09-25 |
| 4462772 | Oil feeding device for scroll fluid apparatus | Masaya Imai, Kenji Tojo, Masao Shiibayashi | 1984-07-31 |