Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9362083 | Charged particle beam apparatus and sample observation method | Yusuke Ominami, Shinsuke Kawanishi, Hiroyuki Suzuki, Kohtaro Hosoya | 2016-06-07 |
| 7081625 | Charged particle beam apparatus | Kouichi Kurosawa, Takehiko Konno, Ryuichi Funatsu | 2006-07-25 |