Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10176968 | Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for same | Kunji Shigeto, Mitsugu Sato, Tsutomu Saito, Yoshihiro Takahoko, Tohru Ando | 2019-01-08 |
| 9362083 | Charged particle beam apparatus and sample observation method | Yusuke Ominami, Shinsuke Kawanishi, Hiroyuki Suzuki, Masanari Furiki | 2016-06-07 |