Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12027342 | Charged particle beam device and axis adjustment method thereof | Yuta Imai, Masahiro Sasajima | 2024-07-02 |
| 11764028 | Charged particle beam device and axis adjustment method thereof | Yuta Imai, Masahiro Sasajima | 2023-09-19 |
| 11342155 | Charged particle beam device and method for adjusting position of detector of charged particle beam device | Yuta Imai, Masahiro Sasajima | 2022-05-24 |
| 10312053 | Charged particle beam apparatus, alignment method of charged particle beam apparatus, alignment program, and storage medium | Kazuki ISHIZAWA, Hiroyuki Chiba, Daichi Nara | 2019-06-04 |
| 10176968 | Method for adjusting charged particle beam device and adjusting beam aperture based on a selected emission condition and charged particle beam device for same | Kunji Shigeto, Mitsugu Sato, Tsutomu Saito, Kohtaro Hosoya, Tohru Ando | 2019-01-08 |
| 9349567 | Charged particle beam device | Daisuke Kobayashi, Masashi Kimura, Masahiro Sasajima | 2016-05-24 |
| D684274 | Sample holder for an electron microscope | Kotaro Hosoya | 2013-06-11 |
| D679411 | Sample holder for an electron microscope | Kotaro Hosoya | 2013-04-02 |