Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11458513 | Charged particle beam apparatus and cleaning method | Akinari Morikawa | 2022-10-04 |
| 10937626 | Holder and charged particle beam apparatus | — | 2021-03-02 |
| 10777379 | Holder and charged particle beam apparatus | — | 2020-09-15 |
| 9881769 | Charged particle beam device and charged particle beam device control method | Kenji Aoki, Tsutomu Saitou, Mitsuhiro Nakamura, Kunji Shigeto | 2018-01-30 |
| 9159530 | Electron microscope sample holder and sample observation method | Masaomi Ohno, Haruhiko Hatano | 2015-10-13 |
| D684274 | Sample holder for an electron microscope | Yoshihiro Takahoko | 2013-06-11 |
| D679411 | Sample holder for an electron microscope | Yoshihiro Takahoko | 2013-04-02 |
| 8044352 | Electron microscopy | Yoshihiko Nakayama, Isao Nagaoki | 2011-10-25 |