Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11458513 | Charged particle beam apparatus and cleaning method | Kotaro Hosoya | 2022-10-04 |
| 9362088 | Charged particle beam device and sample preparation method | Takahiro Sato, Isamu Sekihara | 2016-06-07 |
| 8546770 | Charged particle beam device and sample observation method | Takeshi Sato, Eiko Nakazawa, Susumu Kuwabata | 2013-10-01 |
| 7964845 | Charged particle beam device | Yuusuke Tanba, Mitsugu Sato, Kaname Takahashi, Shunya Watanabe, Mine Nakagawa +1 more | 2011-06-21 |
| 7459683 | Charged particle beam device with DF-STEM image valuation method | Mine Araki, Shunya Watanabe, Chisato Kamiya, Mitsugu Sato, Atsushi Takane +2 more | 2008-12-02 |
| 6963069 | Charged particle beam device | Yuusuke Tanba, Mitsugu Sato, Kaname Takahashi, Shunya Watanabe, Mine Nakagawa +1 more | 2005-11-08 |