Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11221280 | Method of preparing biological tissue sample and method of observing biological tissue section sample | Akira Sawaguchi, Takahito Hashimoto, Masahiko Ajima, Takeshi Kamimura | 2022-01-11 |
| 10852253 | Specimen observation method | Kiyotaka Nakano | 2020-12-01 |
| 10808312 | Charged particle device and wiring method | Yoichiro Hashimoto, Mami Konomi, Shuichi Takeuchi | 2020-10-20 |
| 9963776 | Charged particle device and wiring method | Yoichiro Hashimoto, Mami Konomi, Shuichi Takeuchi | 2018-05-08 |
| 9202668 | Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen | Takafumi Miwa, Yoichi Ose, Mami Konomi, Shunya Watanabe, Yoshinobu Kimura +1 more | 2015-12-01 |
| 9129772 | Transmission electron microscope, and method of observing specimen | Hiroyuki Kobayashi, Susumu Kuwabata | 2015-09-08 |
| 9013572 | Method for observing sample and electronic microscope | Akiko Fujisawa, Hiroyuki Kobayashi | 2015-04-21 |
| 8785883 | Transmission electron microscope, and method of observing specimen | Hiroyuki Kobayashi, Susumu Kuwabata | 2014-07-22 |
| 8546770 | Charged particle beam device and sample observation method | Akinari Morikawa, Takeshi Sato, Susumu Kuwabata | 2013-10-01 |
| 8410440 | Specimen observation method | Masahiro Tomita, Hiroyuki Kobayashi | 2013-04-02 |
| 8288725 | Charged particle beam device | Akiko Fujisawa, Isao Nagaoki | 2012-10-16 |
| 8212224 | Charged particle beam device | Akiko Fujisawa, Hiroyuki Kobayashi | 2012-07-03 |
| 8164058 | Specimen observation method | Masahiro Tomita, Hiroyuki Kobayashi | 2012-04-24 |
| 7838829 | Charged particle beam device | Akiko Fujisawa, Isao Nagaoki | 2010-11-23 |
| 7705305 | Sample observation method and transmission electron microscope | Hiroyuki Kobayashi | 2010-04-27 |
| 7573030 | Specimen observation method | Masahiro Tomita, Hiroyuki Kobayashi | 2009-08-11 |
| 7214938 | Sample observation method and transmission electron microscope | Isao Nagaoki | 2007-05-08 |
| 7041977 | Electron microscope | Isao Nagaoki | 2006-05-09 |
| 6982420 | Sample observation method and transmission electron microscope | Isao Nagaoki | 2006-01-03 |
| 6875983 | Electron microscope and means to set observation conditions | Isao Nagaoki | 2005-04-05 |