| 10808312 |
Charged particle device and wiring method |
Yoichiro Hashimoto, Eiko Nakazawa, Shuichi Takeuchi |
2020-10-20 |
| 10020163 |
Charged particle beam apparatus, specimen observation system and operation program |
Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura +1 more |
2018-07-10 |
| 9963776 |
Charged particle device and wiring method |
Yoichiro Hashimoto, Eiko Nakazawa, Shuichi Takeuchi |
2018-05-08 |
| 9558912 |
Ion milling device |
Asako Kaneko, Hisayuki Takasu, Hirobumi Mutou, Toru Iwaya |
2017-01-31 |
| D774045 |
Display screen with graphical user interface |
Yayoi Konishi, Naoko Ushio, Masako Nishimura, Shunya Watanabe |
2016-12-13 |
| 9472375 |
Charged particle beam device, sample stage unit, and sample observation method |
Yusuke Ominami, Shinsuke Kawanishi, Hiroyuki Suzuki |
2016-10-18 |
| 9466457 |
Observation apparatus and optical axis adjustment method |
Yusuke Ominami, Shinsuke Kawanishi, Sukehiro Ito |
2016-10-11 |
| 9443694 |
Charged particle beam apparatus, specimen observation system and operation program |
Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura +1 more |
2016-09-13 |
| 9355817 |
Ion milling device and ion milling processing method |
Shunya Watanabe, Hisayuki Takasu, Atsushi Kamino |
2016-05-31 |
| 9236217 |
Inspection or observation apparatus and sample inspection or observation method |
Yusuke Ominami, Sukehiro Ito, Tomohisa Ohtaki, Shinsuke Kawanishi |
2016-01-12 |
| 9202668 |
Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen |
Takafumi Miwa, Yoichi Ose, Eiko Nakazawa, Shunya Watanabe, Yoshinobu Kimura +1 more |
2015-12-01 |
| 9086343 |
Methods for observing samples and preprocessing thereof |
Masamichi Shiono, Masako Nishimura |
2015-07-21 |
| 9058957 |
Charged particle beam apparatus |
Kunji Shigeto, Mitsugu Sato, Noriko Iizumi, Hiroyuki Noda, Masako Nishimura +3 more |
2015-06-16 |
| 8933400 |
Inspection or observation apparatus and sample inspection or observation method |
Yusuke Ominami, Sukehiro Ito, Tomohisa Ohtaki, Shinsuke Kawanishi |
2015-01-13 |
| 8698079 |
Method for scanning electron microscope observation of sample floating on liquid surface |
Masamichi Shiono, Masako Nishimura, Susumu Kuwabata |
2014-04-15 |