| 12437958 |
Electron beam application device |
Takashi Ohshima, Hideaki Morishita, Tatsunori Ide, Hiroyasu Shichi, Junichi Katane |
2025-10-07 |
|
| 12334297 |
Electron gun and electron beam application device |
Hideo Morishita, Takashi Ohshima, Toshihide Agemura, Makoto Kuwahara |
2025-06-17 |
|
| 12217928 |
Electron gun and electron microscope |
Hideo Morishita, Takashi Ohshima, Tatsuro Ide, Naohiro Kohmu, Toshihide Agemura +1 more |
2025-02-04 |
|
| 12165828 |
Electron gun and electron beam application apparatus |
Takashi Ohshima, Hideo Morishita, Tatsuro Ide, Naohiro Kohmu, Momoyo Enyama +2 more |
2024-12-10 |
|
| 11784022 |
Electron beam apparatus |
Takashi Ohshima, Tatsuro Ide, Hideo Morishita, Tsunenori Nomaguchi, Toshihide Agemura |
2023-10-10 |
|
| 11251011 |
Electron microscope |
Takashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Momoyo Enyama, Toshihide Agemura |
2022-02-15 |
|
| 10707046 |
Electron source and electron beam device using the same |
Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Tomihiro Hashizume, Noriaki Arai |
2020-07-07 |
|
| 10586674 |
Field emission electron source, method for manufacturing same, and electron beam device |
Toshiaki Kusunoki, Tomihiro Hashizume, Keigo Kasuya, Takashi Ohshima, Yusuke Sakai +1 more |
2020-03-10 |
|
| 9653256 |
Charged particle-beam device |
Akira Ikegami, Hideto Dohi, Hideyuki Kazumi, Naomasa Suzuki, Momoyo Enyama +2 more |
2017-05-16 |
|
| 9640360 |
Ion source and ion beam device using same |
Hiroyasu Shichi, Shinichi Matsubara, Yoshimi Kawanami, Noriaki Arai |
2017-05-02 |
|
| 9530614 |
Charged particle beam device and arithmetic device |
Kotoko Urano, Tomonori Nakano |
2016-12-27 |
|
| 9355815 |
Electron microscope and electron beam detector |
Shin Imamura, Takashi Ohshima, Kenichi Hirane |
2016-05-31 |
|
| 9293293 |
Electron gun and charged particle beam device having an aperture with flare-suppressing coating |
Shun-ichi Watanabe, Takashi Onishi, Kuniyasu Nakamura, Masaru Moriyama, Tomonori Suzuki |
2016-03-22 |
|
| 9202668 |
Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen |
Takafumi Miwa, Eiko Nakazawa, Mami Konomi, Shunya Watanabe, Yoshinobu Kimura +1 more |
2015-12-01 |
|
| 9123501 |
Device for correcting diffraction aberration of electron beam |
Muneyuki Fukuda, Mitsugu Sato, Hiroyuki Ito, Hiroshi Suzuki, Naomasa Suzuki |
2015-09-01 |
|
| 9111716 |
Charged particle microscope |
Shinichi Matsubara, Yoshimi Kawanami, Hiroyuki Tanaka, Hiroyasu Shichi |
2015-08-18 |
|
| 9058959 |
Scanning ion microscope and secondary particle control method |
Yoshimi Kawanami |
2015-06-16 |
|
| 8847173 |
Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same |
Yoshimi Kawanami, Shinichi Matsubara, Hironori Moritani, Noriaki Arai, Hiroyasu Shichi +4 more |
2014-09-30 |
|
| 8835844 |
Sample electrification measurement method and charged particle beam apparatus |
Makoto Ezumi, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more |
2014-09-16 |
|
| 8698080 |
Scanning electron microscope |
Noriaki Arai, Makoto Ezumi |
2014-04-15 |
|
| 8455841 |
Ion microscope |
Norihide Saho, Hiroyuki Tanaka, Noriaki Arai, Hiroyasu Shichi |
2013-06-04 |
|
| 8067733 |
Scanning electron microscope having a monochromator |
Wataru MORI, Makoto Ezumi |
2011-11-29 |
$168,000 |
| 7838827 |
Monochromator and scanning electron microscope using the same |
Shunroku Taya, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato, Makoto Ezumi |
2010-11-23 |
$82,000 |
| 7825377 |
Electron beam apparatus with aberration corrector |
Takeshi Kawasaki, Takaho Yoshida, Hideo Todokoro |
2010-11-02 |
$84,000 |
| 7700918 |
Sample electrification measurement method and charged particle beam apparatus |
Makoto Ezumi, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more |
2010-04-20 |
$83,000 |
