Issued Patents All Time
Showing 25 most recent of 71 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12334297 | Electron gun and electron beam application device | Hideo Morishita, Takashi Ohshima, Toshihide Agemura, Makoto Kuwahara | 2025-06-17 |
| 12217928 | Electron gun and electron microscope | Hideo Morishita, Takashi Ohshima, Tatsuro Ide, Naohiro Kohmu, Toshihide Agemura +1 more | 2025-02-04 |
| 12165828 | Electron gun and electron beam application apparatus | Takashi Ohshima, Hideo Morishita, Tatsuro Ide, Naohiro Kohmu, Momoyo Enyama +2 more | 2024-12-10 |
| 11784022 | Electron beam apparatus | Takashi Ohshima, Tatsuro Ide, Hideo Morishita, Tsunenori Nomaguchi, Toshihide Agemura | 2023-10-10 |
| 11251011 | Electron microscope | Takashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Momoyo Enyama, Toshihide Agemura | 2022-02-15 |
| 10707046 | Electron source and electron beam device using the same | Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Tomihiro Hashizume, Noriaki Arai | 2020-07-07 |
| 10586674 | Field emission electron source, method for manufacturing same, and electron beam device | Toshiaki Kusunoki, Tomihiro Hashizume, Keigo Kasuya, Takashi Ohshima, Yusuke Sakai +1 more | 2020-03-10 |
| 9653256 | Charged particle-beam device | Akira Ikegami, Hideto Dohi, Hideyuki Kazumi, Naomasa Suzuki, Momoyo Enyama +2 more | 2017-05-16 |
| 9640360 | Ion source and ion beam device using same | Hiroyasu Shichi, Shinichi Matsubara, Yoshimi Kawanami, Noriaki Arai | 2017-05-02 |
| 9530614 | Charged particle beam device and arithmetic device | Kotoko Urano, Tomonori Nakano | 2016-12-27 |
| 9355815 | Electron microscope and electron beam detector | Shin Imamura, Takashi Ohshima, Kenichi Hirane | 2016-05-31 |
| 9293293 | Electron gun and charged particle beam device having an aperture with flare-suppressing coating | Shun-ichi Watanabe, Takashi Onishi, Kuniyasu Nakamura, Masaru Moriyama, Tomonori Suzuki | 2016-03-22 |
| 9202668 | Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen | Takafumi Miwa, Eiko Nakazawa, Mami Konomi, Shunya Watanabe, Yoshinobu Kimura +1 more | 2015-12-01 |
| 9123501 | Device for correcting diffraction aberration of electron beam | Muneyuki Fukuda, Mitsugu Sato, Hiroyuki Ito, Hiroshi Suzuki, Naomasa Suzuki | 2015-09-01 |
| 9111716 | Charged particle microscope | Shinichi Matsubara, Yoshimi Kawanami, Hiroyuki Tanaka, Hiroyasu Shichi | 2015-08-18 |
| 9058959 | Scanning ion microscope and secondary particle control method | Yoshimi Kawanami | 2015-06-16 |
| 8847173 | Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same | Yoshimi Kawanami, Shinichi Matsubara, Hironori Moritani, Noriaki Arai, Hiroyasu Shichi +4 more | 2014-09-30 |
| 8835844 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2014-09-16 |
| 8698080 | Scanning electron microscope | Noriaki Arai, Makoto Ezumi | 2014-04-15 |
| 8455841 | Ion microscope | Norihide Saho, Hiroyuki Tanaka, Noriaki Arai, Hiroyasu Shichi | 2013-06-04 |
| 8067733 | Scanning electron microscope having a monochromator | Wataru MORI, Makoto Ezumi | 2011-11-29 |
| 7838827 | Monochromator and scanning electron microscope using the same | Shunroku Taya, Hideo Todokoro, Tadashi Otaka, Mitsugu Sato, Makoto Ezumi | 2010-11-23 |
| 7825377 | Electron beam apparatus with aberration corrector | Takeshi Kawasaki, Takaho Yoshida, Hideo Todokoro | 2010-11-02 |
| 7700918 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima, Takahiro Sato +2 more | 2010-04-20 |
| 7612336 | Scanning electron microscope having a monochromator | Wataru MORI, Makoto Ezumi | 2009-11-03 |