| 12437958 |
Electron beam application device |
Takashi Ohshima, Hideaki Morishita, Tatsunori Ide, Hiroyasu Shichi, Yoichi Ose |
2025-10-07 |
|
| 12431325 |
Sample image observation device and method for same |
Yuta Imai |
2025-09-30 |
|
| 12400827 |
Charged particle beam device |
Teruo Kohashi, Hideo Morishita, Tatsuro Ide |
2025-08-26 |
|
| 12217928 |
Electron gun and electron microscope |
Hideo Morishita, Takashi Ohshima, Tatsuro Ide, Naohiro Kohmu, Toshihide Agemura +1 more |
2025-02-04 |
|
| 12165828 |
Electron gun and electron beam application apparatus |
Takashi Ohshima, Hideo Morishita, Tatsuro Ide, Naohiro Kohmu, Momoyo Enyama +2 more |
2024-12-10 |
|
| 11961699 |
Charged particle beam device |
Hideo Morishita, Teruo Kohashi, Hiroyuki Yamamoto |
2024-04-16 |
|
| 11823861 |
Charged particle beam device |
Yuta Imai |
2023-11-21 |
|
| 11756763 |
Scanning electron microscope |
Teruo Kohashi, Hideo Morishita |
2023-09-12 |
|
| 11640897 |
Charged particle beam device |
Ryo HIRANO, Tsunenori Nomaguchi, Chisato Kamiya |
2023-05-02 |
|
| 11430630 |
Charged particle beam apparatus |
Ryo HIRANO, Tsunenori Nomaguchi, Chisato Kamiya |
2022-08-30 |
|
| 11170972 |
Scanning electron microscope and method for analyzing secondary electron spin polarization |
Teruo Kohashi, Hideo Morishita |
2021-11-09 |
|
| 10886101 |
Charged particle beam device |
Ryo HIRANO, Hideo Morishita, Toshihide Agemura, Tsunenori Nomaguchi |
2021-01-05 |
|
| 9824854 |
Charged particle beam device, image generation method, observation system |
Yusuke Ominami, Shinsuke Kawanishi, Sukehiro Ito |
2017-11-21 |
|
| 8692195 |
Charged particle radiation device |
Sukehiro Ito |
2014-04-08 |
|
| D687475 |
Electron microscope |
Mitsuru Oonuma, Akira Omachi, Mitsuo Akatsu, Hiroyuki Komuro, Tomoyasu Hirashima |
2013-08-06 |
|
| 8294097 |
Charged particle radiation device |
Sukehiro Ito |
2012-10-23 |
|
| 8143573 |
Charged particle beam apparatus |
Sukehiro Ito, Shigeru Kawamata, Shinichi Tomita |
2012-03-27 |
$164,000 |
| 8026491 |
Charged particle beam apparatus and method for charged particle beam adjustment |
Takeshi Ogashiwa, Mitsugu Sato, Atsushi Takane, Toshihide Agemura, Yuusuke Narita +3 more |
2011-09-27 |
$178,000 |
| 7755045 |
Scanning electron microscope |
Michio Hatano, Sukehiro Ito, Shinichi Tomita |
2010-07-13 |
$64,000 |
| 7557346 |
Scanning electron microscope |
Sukehiro Ito |
2009-07-07 |
$76,000 |
| 7511271 |
Scanning electron microscope |
Michio Hatano, Sukehiro Ito, Shinichi Tomita |
2009-03-31 |
$69,000 |
| 7154089 |
Scanning electron microscope |
Sukehiro Ito |
2006-12-26 |
$98,000 |