Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12215308 | Charged particle beam apparatus and cell evaluation method | Akira Ikeuchi, Hiromi Mise, Akira Sawaguchi | 2025-02-04 |
| 11404242 | Charged particle beam device and method for setting condition in charged particle beam device | Yuki NUMATA, Hirofumi Sato | 2022-08-02 |
| 11385193 | Imaging device | Hiroyuki Chiba, Miku Maehara, Yoshinobu Hoshino | 2022-07-12 |
| 11321585 | Imaging device and morphological feature data display method | Yaku Maeda, Akira Ikeuchi, Hiromi Mise, Akira Sawaguchi | 2022-05-03 |
| 11239050 | Imaging device | Miku Maehara, Yoshinobu Hoshino, Hiroyuki Chiba | 2022-02-01 |
| 10763078 | Charged particle beam device and image processing method in charged particle beam device | Masato Kamio, Masashi Watanabe, Katsunori Hirano, Yoshinobu Hoshino, Yuichi Sakurai | 2020-09-01 |
| 10763074 | Charged particle beam apparatus, observation method using charged particle beam apparatus, and program | Hiroyuki Chiba, Yoshinobu Hoshino | 2020-09-01 |
| 10522325 | Charged particle beam device and image processing method in charged particle beam device | Masato Kamio, Masashi Watanabe, Katsunori Hirano, Yoshinobu Hoshino, Yuichi Sakurai | 2019-12-31 |
| 10453650 | Charged particle beam apparatus, observation method using charged particle beam apparatus, and program | Hiroyuki Chiba, Yoshinobu Hoshino | 2019-10-22 |
| 9202669 | Charged particle beam device and image display method for stereoscopic observation and stereoscopic display | Tatsuya Hirato, Hiroyuki Komuro | 2015-12-01 |
| 9099283 | Charged particle beam apparatus | Yoshinobu Hoshino, Eisaku Oho | 2015-08-04 |
| 9012842 | Charged particle beam device and inclined observation image display method | Wataru Kotake, Sukehiro Ito | 2015-04-21 |
| 8947520 | Electron microscope | Yoshinobu Hoshino | 2015-02-03 |
| 8848049 | Charged particle beam device and method for correcting detected signal thereof | Masato Kamio, Masashi Watanabe, Yoshinobu Hoshino | 2014-09-30 |
| 8143573 | Charged particle beam apparatus | Sukehiro Ito, Junichi Katane, Shinichi Tomita | 2012-03-27 |
| 7705304 | Scanning electron microscope and three-dimensional shape measuring device that used it | Yoshinobu Hoshino, Asako Kaneko | 2010-04-27 |
| 5523567 | Scanning electron microscope and image forming method therewith | Susumu Ozasa | 1996-06-04 |
| 5142147 | Image processing device for an electron microscope | Tomoyasu Hirashima | 1992-08-25 |
| 4257060 | Semiconductor switch | Kiyoshi Tsukuda | 1981-03-17 |