Issued Patents All Time
Showing 1–25 of 36 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12334297 | Electron gun and electron beam application device | Hideo Morishita, Takashi Ohshima, Yoichi Ose, Makoto Kuwahara | 2025-06-17 |
| 12217928 | Electron gun and electron microscope | Hideo Morishita, Takashi Ohshima, Tatsuro Ide, Naohiro Kohmu, Yoichi Ose +1 more | 2025-02-04 |
| 12165828 | Electron gun and electron beam application apparatus | Takashi Ohshima, Hideo Morishita, Tatsuro Ide, Naohiro Kohmu, Momoyo Enyama +2 more | 2024-12-10 |
| 11784022 | Electron beam apparatus | Takashi Ohshima, Tatsuro Ide, Hideo Morishita, Yoichi Ose, Tsunenori Nomaguchi | 2023-10-10 |
| 11610754 | Charged particle beam device | Katsura Takaguchi, Yohei Nakamura, Masahiro Sasajima, Natsuki Tsuno | 2023-03-21 |
| 11393657 | Electron beam device | Minami Shouji, Natsuki Tsuno | 2022-07-19 |
| 11251011 | Electron microscope | Takashi Ohshima, Hiroyuki Minemura, Yumiko Anzai, Momoyo Enyama, Yoichi Ose | 2022-02-15 |
| 11189457 | Scanning electron microscope | Hideo Morishita | 2021-11-30 |
| 11183362 | Charged particle beam apparatus and sample observation method using the same | Katsura Takaguchi, Natsuki Tsuno, Masahiro Sasajima | 2021-11-23 |
| 11139143 | Spin polarimeter | Hideo Morishita, Teruo Kohashi | 2021-10-05 |
| 11107656 | Charged particle beam device | Tsunenori Nomaguchi, Shunichi Motomura, Kenichi Nishinaka | 2021-08-31 |
| 11043358 | Measuring apparatus and method of setting observation condition | Ryoko Araki, Natsuki Tsuno, Yohei Nakamura, Masahiro Sasajima, Mitsuhiro Nakamura | 2021-06-22 |
| 10886101 | Charged particle beam device | Ryo HIRANO, Hideo Morishita, Junichi Katane, Tsunenori Nomaguchi | 2021-01-05 |
| 10872744 | Charged particle beam apparatus | Munekazu KOYANAGI, Wataru Suzuki | 2020-12-22 |
| 10453648 | Charged particle bean device and information-processing device | Yoshinobu Kimura, Natsuki Tsuno, Takeshi Ogashiwa, Junichiro Tomizawa | 2019-10-22 |
| 10297416 | Scanning electron microscope | Masashi Sasaki, Daisuke Kobayashi, Shunsuke Sato | 2019-05-21 |
| 10249471 | Composite charged particle beam apparatus and control method thereof | — | 2019-04-02 |
| 10128081 | Composite charged particle beam detector, charged particle beam device, and charged particle beam detector | Tsunenori Nomaguchi | 2018-11-13 |
| 10014151 | Composite charged particle beam device | Yuta Imai, Hideo Morishita | 2018-07-03 |
| 9966218 | Electron beam device | Tsunenori Nomaguchi | 2018-05-08 |
| 9761409 | Composite charged particle detector, charged particle beam device, and charged particle detector | Tsunenori Nomaguchi | 2017-09-12 |
| 9536703 | Scanning electron microscope | Hideo Morishita | 2017-01-03 |
| 9478389 | Scanning electron microscope | Tsunenori Nomaguchi | 2016-10-25 |
| 9355814 | Charged particle beam apparatus | Tsunenori Nomaguchi | 2016-05-31 |
| 8680465 | Charged particle beam apparatus and film thickness measurement method | Satoshi Tomimatsu, Tsuyoshi Onishi, Terutaka Nanri | 2014-03-25 |