Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12027342 | Charged particle beam device and axis adjustment method thereof | Yuta Imai, Yoshihiro Takahoko | 2024-07-02 |
| 11764028 | Charged particle beam device and axis adjustment method thereof | Yuta Imai, Yoshihiro Takahoko | 2023-09-19 |
| 11610754 | Charged particle beam device | Katsura Takaguchi, Yohei Nakamura, Toshihide Agemura, Natsuki Tsuno | 2023-03-21 |
| 11342155 | Charged particle beam device and method for adjusting position of detector of charged particle beam device | Yuta Imai, Yoshihiro Takahoko | 2022-05-24 |
| 11183362 | Charged particle beam apparatus and sample observation method using the same | Katsura Takaguchi, Natsuki Tsuno, Toshihide Agemura | 2021-11-23 |
| 11043358 | Measuring apparatus and method of setting observation condition | Ryoko Araki, Natsuki Tsuno, Yohei Nakamura, Mitsuhiro Nakamura, Toshihide Agemura | 2021-06-22 |
| 10971347 | Charged particle beam apparatus | Mitsuhiro Nakamura, Hironori ITABASHI, Hirofumi Satou, Tsutomu Saito, Natsuki Tsuno +1 more | 2021-04-06 |
| D794816 | Sample holder for an electron microscope | Kazuhiro Koyama | 2017-08-15 |
| 9349567 | Charged particle beam device | Yoshihiro Takahoko, Daisuke Kobayashi, Masashi Kimura | 2016-05-24 |
| 8816712 | Inspection device | Mitsuhiro Nakamura, Hiroshi Toyama, Yasuhiko Nara, Katsuo Oki, Tomoharu Obuki | 2014-08-26 |
| 8309922 | Semiconductor inspection method and device that consider the effects of electron beams | Tohru Ando | 2012-11-13 |
| 7989766 | Sample inspection apparatus | Yasuhiko Nara, Tohru Ando, Tsutomu Saito, Tomoharu Obuki, Isamu Sekihara | 2011-08-02 |
| 7932733 | Apparatus for detecting defect by examining electric characteristics of a semiconductor device | Hiroyuki Suzuki | 2011-04-26 |
| D579120 | Sample holder | Hiroyuki Suzuki | 2008-10-21 |
| D578653 | Sample holder | Hiroyuki Suzuki | 2008-10-14 |
| D578655 | Sample holder | Hiroyuki Suzuki | 2008-10-14 |