Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11719746 | Semiconductor inspection device | Masaaki Komori | 2023-08-08 |
| 11513138 | Semiconductor inspection device and probe unit | Masaaki Komori | 2022-11-29 |
| 10782340 | Dynamic response analysis prober device | Masaaki Komori, Yasuhiko Nara, Takayuki Mizuno | 2020-09-22 |
| 8816712 | Inspection device | Mitsuhiro Nakamura, Hiroshi Toyama, Yasuhiko Nara, Tomoharu Obuki, Masahiro Sasajima | 2014-08-26 |