Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8816712 | Inspection device | Mitsuhiro Nakamura, Hiroshi Toyama, Yasuhiko Nara, Katsuo Oki, Masahiro Sasajima | 2014-08-26 |
| 8178840 | Specimen inspection equipment and how to make the electron beam absorbed current images | Hiroshi Toyama, Yasuhiro Mitsui, Munetoshi Fukui, Yasuhiko Nara, Tohru Ando +3 more | 2012-05-15 |
| 7989766 | Sample inspection apparatus | Yasuhiko Nara, Tohru Ando, Masahiro Sasajima, Tsutomu Saito, Isamu Sekihara | 2011-08-02 |
| 7663104 | Specimen inspection equipment and how to make electron beam absorbed current images | Hiroshi Toyama, Yasuhiro Mitsui, Munetoshi Fukui, Yasuhiko Nara, Tohru Ando +3 more | 2010-02-16 |