Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8178840 | Specimen inspection equipment and how to make the electron beam absorbed current images | Tomoharu Obuki, Hiroshi Toyama, Yasuhiro Mitsui, Yasuhiko Nara, Tohru Ando +3 more | 2012-05-15 |
| 7663104 | Specimen inspection equipment and how to make electron beam absorbed current images | Tomoharu Obuki, Hiroshi Toyama, Yasuhiro Mitsui, Yasuhiko Nara, Tohru Ando +3 more | 2010-02-16 |