Issued Patents All Time
Showing 25 most recent of 72 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11094503 | Method of preparing thin film sample piece and charged particle beam apparatus | Masato Suzuki, Ikuko Nakatani, Makoto Sato | 2021-08-17 |
| 10832890 | Charged particle beam device | Masato Suzuki, Makoto Sato, Tatsuya Asahata | 2020-11-10 |
| 10692688 | Charged particle beam apparatus | Makoto Sato, Masato Suzuki | 2020-06-23 |
| 10658147 | Charged particle beam apparatus | Makoto Sato, Atsushi Uemoto, Tatsuya Asahata | 2020-05-19 |
| 10629411 | Charged particle beam apparatus | Tatsuya Asahata, Makoto Sato, Masato Suzuki | 2020-04-21 |
| 10236159 | Charged particle beam apparatus | Makoto Sato, Atsushi Uemoto, Tatsuya Asahata, Yo Yamamoto | 2019-03-19 |
| 10233548 | Charged particle beam device and sample production method | Terutaka Nanri, Tsuyoshi Onishi | 2019-03-19 |
| 9934940 | Control device, charged particle beam apparatus, program and method for producing processed product | Tsuyoshi Oonishi, Hiroki Kawada, Hideo Sakai | 2018-04-03 |
| 9620333 | Charged particle beam apparatus | Makoto Sato, Atsushi Uemoto, Tatsuya Asahata, Yo Yamamoto | 2017-04-11 |
| 9449786 | Charged particle radiation device and specimen preparation method using said device | Miki Tsuchiya, Yasuhira Nagakubo | 2016-09-20 |
| 9330883 | Charged particle beam device | Terutaka Nanri, Isamu Sekihara | 2016-05-03 |
| 9202672 | Apparatus and method for probe shape processing by ion beam | Shinya Kitayama, Tsuyoshi Onishi | 2015-12-01 |
| 9111721 | Ion beam device and machining method | Shinya Kitayama, Tsuyoshi Onishi | 2015-08-18 |
| 8933423 | Charged particle beam device and sample production method | Terutaka Nanri | 2015-01-13 |
| 8912487 | Charged particle beam device, position specification method used for charged particle beam device, and program | Kunio Sakamoto, Megumi Aizawa, Isamu Sekihara | 2014-12-16 |
| 8796651 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Tohru Ishitani, Hidemi Koike, Kaoru Umemura, Eiichi Seya +3 more | 2014-08-05 |
| 8791413 | Charged particle beam device and sample observation method using a rotating detector | Shinya Kitayama, Wataru Suzuki | 2014-07-29 |
| 8779400 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Hiroyasu Shichi, Kaoru Umemura, Noriyuki Kaneoka, Koji Ishiguro | 2014-07-15 |
| 8680465 | Charged particle beam apparatus and film thickness measurement method | Tsuyoshi Onishi, Toshihide Agemura, Terutaka Nanri | 2014-03-25 |
| 8618520 | Method and apparatus for processing a micro sample | Mitsuo Tokuda, Muneyuki Fukuda, Yasuhiro Mitsui, Hidemi Koike, Hiroyasu Shichi +2 more | 2013-12-31 |
| 8569719 | Method and apparatus for specimen fabrication | Kaoru Umemura, Yuichi Madokoro, Yoshimi Kawanami, Yasunori Doi | 2013-10-29 |
| 8530865 | Gas field ion source, charged particle microscope, and apparatus | Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Tomihiro Hashizume, Tohru Ishitani | 2013-09-10 |
| 8481980 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Hiroyasu Shichi, Kaoru Umemura, Noriyuki Kaneoka, Koji Ishiguro | 2013-07-09 |
| 8450699 | Electron beam device and electron beam application device using the same | Takashi Ohshima | 2013-05-28 |
| 8431891 | Dual beam apparatus with tilting sample stage | Hiroyasu Shichi, Noriyuki Kaneoka, Kaoru Umemura, Koji Ishiguro | 2013-04-30 |