TH

Tomihiro Hashizume

HI Hitachi: 23 patents #1,433 of 28,497Top 6%
HH Hitachi High-Technologies: 13 patents #394 of 1,917Top 25%
HI Hitchi: 1 patents #1 of 56Top 2%
Overall (All Time): #88,791 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 25 most recent of 37 patents

Patent #TitleCo-InventorsDate
12400823 Electron source, method of manufacturing the same, and electron beam apparatus using the same Toshiaki Kusunoki, Noriaki Arai, Keigo Kasuya 2025-08-26
11322329 Electron source, method for manufacturing the same, and electron beam device using the same Toshiaki Kusunoki, Keigo Kasuya, Noriaki Arai, Hiromitsu Seino, Minoru Kaneda +2 more 2022-05-03
11143606 Particle measuring device and particle measuring method Masatoshi Yasutake, Tsunenori Nomaguchi, Takafumi Miwa 2021-10-12
10971329 Field ionization source, ion beam apparatus, and beam irradiation method Shinichi Matsubara, Hiroyasu Shichi, Yoshimi Kawanami 2021-04-06
10840070 Ion beam device and cleaning method for gas field ion source Yoshimi Kawanami, Atsushi Kobaru, Hiroyasu Shichi, Shinichi Matsubara 2020-11-17
10707046 Electron source and electron beam device using the same Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Noriaki Arai, Yoichi Ose 2020-07-07
10697767 Sample for measuring particles, method for measuring particles and apparatus for measuring particles Masatoshi Yasutake, Sanato NAGATA 2020-06-30
10586674 Field emission electron source, method for manufacturing same, and electron beam device Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Yusuke Sakai, Yoichi Ose +1 more 2020-03-10
10522319 Electron beam apparatus Keigo Kasuya, Noriaki Arai, Toshiaki Kusunoki, Takashi Ohshima, Yusuke Sakai 2019-12-31
10211022 Ion beam apparatus and ion beam irradiation method Shinichi Matsubara, Hiroyasu Shichi, Yoshimi Kawanami 2019-02-19
10073116 Scanning probe microscope and its sample holder Sanato NAGATA, Akira Nambu, Hideaki Koizumi 2018-09-11
9875878 Sample holder and analytical vacuum device Takeshi Nakayama, Akira Sugawara 2018-01-23
9423416 Scanning probe microscope and measuring method using same Akira Nambu, Tsuyoshi Yamamoto, Hideaki Koizumi, Seiji Heike 2016-08-23
8847173 Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same Yoshimi Kawanami, Shinichi Matsubara, Hironori Moritani, Noriaki Arai, Hiroyasu Shichi +4 more 2014-09-30
8530865 Gas field ion source, charged particle microscope, and apparatus Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Satoshi Tomimatsu, Tohru Ishitani 2013-09-10
8115184 Gas field ion source, charged particle microscope, and apparatus Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Satoshi Tomimatsu, Tohru Ishitani 2012-02-14
8008654 Thin-film transistor device and a method for manufacturing the same Takeo Shiba, Yuji Suwa, Tadashi Arai 2011-08-30
7872257 Organic thin film transistor array and method of manufacturing the same Yuji Suwa, Masaaki Fujimori, Tadashi Arai, Takeo Shiba 2011-01-18
7872254 Wiring and organic transistor, and manufacturing method thereof Yuji Suwa, Masaaki Fujimori 2011-01-18
7807496 Field effect transistor and its manufacturing method Masaaki Fujimori, Masahiko Ando 2010-10-05
7799701 Method of coating substrate Seiji Heike, Masayoshi Ishibashi 2010-09-21
7772622 Field effect transistor and manufacturing method thereof Masaaki Fujimori, Masahiko Ando 2010-08-10
7622734 Organic transistor using self-assembled monolayer Yuji Suwa, Masahiko Ando, Takeo Shiba 2009-11-24
7608857 Field effect transistor having a structure in which an organic semiconductor that forms a channel is made of a single crystal or a polycrystal of organic molecules Masaaki Fujimori, Masahiko Ando 2009-10-27
7557662 Oscillator and frequency detector Seiji Heike 2009-07-07