Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400823 | Electron source, method of manufacturing the same, and electron beam apparatus using the same | Toshiaki Kusunoki, Tomihiro Hashizume, Keigo Kasuya | 2025-08-26 |
| 12157705 | Freeze-cast ceramic membrane for size based filtration | Katherine T. Faber, Julia A. Kornfield, Orland Bateman, Rustem F. Ismagilov | 2024-12-03 |
| 11760698 | Freeze-cast ceramic membrane for size based filtration | Katherine T. Faber, Julia A. Kornfield, Orland Bateman, Rustem F. Ismagilov | 2023-09-19 |
| 11322329 | Electron source, method for manufacturing the same, and electron beam device using the same | Toshiaki Kusunoki, Tomihiro Hashizume, Keigo Kasuya, Hiromitsu Seino, Minoru Kaneda +2 more | 2022-05-03 |
| 11242290 | Freeze-cast ceramic membrane for size based filtration | Katherine T. Faber, Julia A. Kornfield, Orland Bateman, Rustem F. Ismagilov | 2022-02-08 |
| 10996216 | Method for separating cells, and device therefor | — | 2021-05-04 |
| 10707046 | Electron source and electron beam device using the same | Toshiaki Kusunoki, Keigo Kasuya, Takashi Ohshima, Tomihiro Hashizume, Yoichi Ose | 2020-07-07 |
| 10586674 | Field emission electron source, method for manufacturing same, and electron beam device | Toshiaki Kusunoki, Tomihiro Hashizume, Keigo Kasuya, Takashi Ohshima, Yusuke Sakai +1 more | 2020-03-10 |
| 10522319 | Electron beam apparatus | Keigo Kasuya, Toshiaki Kusunoki, Takashi Ohshima, Tomihiro Hashizume, Yusuke Sakai | 2019-12-31 |
| 9640360 | Ion source and ion beam device using same | Hiroyasu Shichi, Shinichi Matsubara, Yoichi Ose, Yoshimi Kawanami | 2017-05-02 |
| 9508521 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Masahiro Yamaoka | 2016-11-29 |
| 8847173 | Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same | Yoshimi Kawanami, Shinichi Matsubara, Hironori Moritani, Hiroyasu Shichi, Tomihiro Hashizume +4 more | 2014-09-30 |
| 8835884 | Charged particle beam apparatus with cleaning photo-irradiation apparatus | — | 2014-09-16 |
| 8779380 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Masahiro Yamaoka | 2014-07-15 |
| 8698080 | Scanning electron microscope | Makoto Ezumi, Yoichi Ose | 2014-04-15 |
| 8563944 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Tohru Ishitani | 2013-10-22 |
| 8455841 | Ion microscope | Norihide Saho, Hiroyuki Tanaka, Hiroyasu Shichi, Yoichi Ose | 2013-06-04 |
| 8263943 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Tohru Ishitani | 2012-09-11 |
| 8153966 | Electrode unit and charged particle beam device | Hideyuki Kazumi | 2012-04-10 |
| 7705300 | Charged particle beam adjusting method and charged particle beam apparatus | Hidetoshi Morokuma, Takashi Doi, Fumihiro Sasajima, Yoshihiro Kimura | 2010-04-27 |
| 7566872 | Scanning electron microscope | Ritsuo Fukaya, Hidetoshi Sato, Zhigang Wang, Makoto Ezumi | 2009-07-28 |
| 7459681 | Scanning electron microscope | Makoto Ezumi, Yoichi Ose | 2008-12-02 |
| 7408172 | Charged particle beam apparatus and charged particle beam irradiation method | Mitsugu Sato, Hideo Todokoro, Yoichi Ose, Makoto Ezumi, Takashi Doi | 2008-08-05 |
| 7381951 | Charged particle beam adjustment method and apparatus | Takashi Doi, Hidetoshi Morokuma, Katsumi Setoguchi, Fumihiro Sasajima, Maki Tanaka +1 more | 2008-06-03 |
| 7282722 | Charged particle beam apparatus and charged particle beam irradiation method | Mitsugu Sato, Hideo Todokoro, Yoichi Ose, Makoto Ezumi, Takashi Doi | 2007-10-16 |