Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379392 | Surface analysis device | Yasuhiro Ando, Yoshihiro Isozaki | 2025-08-05 |
| 8969801 | Scanning electron microscope | Nobuhiro Okai, Yasunari Sohda, Zhigang Wang | 2015-03-03 |
| 8907267 | Charged particle beam device | Zhigang Wang, Nobuhiro Okai, Hidetoshi Sato | 2014-12-09 |
| 8835844 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2014-09-16 |
| 8692197 | Scanning electron microscope optical condition setting method and scanning electron microscope | Zhigang Wang, Nobuhiro Okai | 2014-04-08 |
| 8487251 | Method for controlling charging of sample and scanning electron microscope | Nobuhiro Okai, Koki Miyahara, Zhigang Wang | 2013-07-16 |
| 8178836 | Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope | Tatsuaki Ishijima, Katsuhiro Sasada | 2012-05-15 |
| 8080789 | Sample dimension measuring method and scanning electron microscope | Osamu Nasu, Tadashi Otaka, Hiroki Kawada, Makoto Ezumi | 2011-12-20 |
| 7851756 | Charged particle beam irradiation system | Zhigang Wang | 2010-12-14 |
| 7745782 | Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope | Tatsuaki Ishijima, Katsuhiro Sasada | 2010-06-29 |
| 7700918 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2010-04-20 |
| 7659508 | Method for measuring dimensions of sample and scanning electron microscope | Osamu Nasu, Tadashi Otaka, Hiroki Kawada, Makoto Ezumi | 2010-02-09 |
| 7566872 | Scanning electron microscope | Hidetoshi Sato, Zhigang Wang, Noriaki Arai, Makoto Ezumi | 2009-07-28 |
| 7372028 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2008-05-13 |
| 7087899 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2006-08-08 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Tatsuaki Ishijima +2 more | 2005-09-20 |
| 6300995 | Liquid crystal display device utilizing in-plane-switching system and having alignment film separating picture element electrode or counter electrode from liquid crystal layer | Masatoshi Wakagi, Masahiko Ando | 2001-10-09 |
| 6184946 | Active matrix liquid crystal display | Masahiko Ando, Masatoshi Wakagi | 2001-02-06 |
| 5995187 | Liquid crystal display device in-plane-switching system with counter electrode in contact with liquid crystal | Masatoshi Wakagi, Masahiko Ando | 1999-11-30 |