Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9129775 | Specimen potential measuring method, and charged particle beam device | Osamu Nasu, Muneyuki Fukuda, Takeyoshi Ohashi, Hiromasa Yamanashi, Takuji Miyamoto +1 more | 2015-09-08 |
| 8835844 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Takahiro Sato +2 more | 2014-09-16 |
| 8178836 | Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope | Katsuhiro Sasada, Ritsuo Fukaya | 2012-05-15 |
| 7745782 | Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope | Katsuhiro Sasada, Ritsuo Fukaya | 2010-06-29 |
| 7700918 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Takahiro Sato +2 more | 2010-04-20 |
| 7372028 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Takahiro Sato +2 more | 2008-05-13 |
| 7087899 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Takahiro Sato +2 more | 2006-08-08 |
| 6946656 | Sample electrification measurement method and charged particle beam apparatus | Makoto Ezumi, Yoichi Ose, Akira Ikegami, Hideo Todokoro, Takahiro Sato +2 more | 2005-09-20 |