Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852599 | Image processing system | Naomasa Suzuki, Muneyuki Fukuda | 2023-12-26 |
| 11211224 | Charged particle beam apparatus | Daisuke Bizen, Tomoyasu Shojo, Naomasa Suzuki, Muneyuki Fukuda | 2021-12-28 |
| 10121632 | Charged particle beam apparatus | Natsuki Tsuno, Naomasa Suzuki, Tomoyasu Shojo | 2018-11-06 |
| 9261360 | Charged particle beam microscope | Yasunari Sohda, Junichi Tanaka | 2016-02-16 |
| 8969801 | Scanning electron microscope | Yasunari Sohda, Ritsuo Fukaya, Zhigang Wang | 2015-03-03 |
| 8907267 | Charged particle beam device | Zhigang Wang, Hidetoshi Sato, Ritsuo Fukaya | 2014-12-09 |
| 8742342 | Electron microscope | Yasunari Sohda | 2014-06-03 |
| 8692197 | Scanning electron microscope optical condition setting method and scanning electron microscope | Zhigang Wang, Ritsuo Fukaya | 2014-04-08 |
| 8487251 | Method for controlling charging of sample and scanning electron microscope | Ritsuo Fukaya, Koki Miyahara, Zhigang Wang | 2013-07-16 |
| 8125518 | Scanning electron microscope | Yasunari Sohda | 2012-02-28 |
| 8064681 | Method and apparatus for inspecting reticle | Shinji Okazaki, Yasunari Sohda, Yoshinori Nakayama | 2011-11-22 |