Issued Patents All Time
Showing 25 most recent of 38 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11902014 | Signal processing device and transmission device | — | 2024-02-13 |
| 11888526 | Optical transmitter, communication apparatus, and method of controlling bias voltage of electro-optic modulator | Shoichi Murakami, Kosuke Komaki, Yuya Osumi, Yusuke SHIGETA | 2024-01-30 |
| 10105041 | Light guiding optical system and endoscopic apparatus having the same | Akira Yamamoto | 2018-10-23 |
| 9874645 | POS system, bar code scanner, and method for controlling POS system | — | 2018-01-23 |
| 9609795 | Method of supplying solder to printed circuit board | Yoshitaka Narita, Takeshi Fujimoto | 2017-03-28 |
| 9507280 | Printer | Motoki Kobayashi | 2016-11-29 |
| 9381735 | Printing device | Motoki Kobayashi | 2016-07-05 |
| 9132497 | Viscous material feeder and viscous material printer | — | 2015-09-15 |
| 9044929 | Printing apparatus | — | 2015-06-02 |
| 8907267 | Charged particle beam device | Zhigang Wang, Nobuhiro Okai, Ritsuo Fukaya | 2014-12-09 |
| 8645953 | Method of checking a possibility of executing a virtual machine | Tomoki Sekiguchi | 2014-02-04 |
| 8585112 | Sample conveying mechanism | Katsuya Kawakami, Masahiro Tsunoda, Takashi Gunji | 2013-11-19 |
| 8461457 | Grommet | Kouji Miyakoshi, Akimizu Kamishima, Yutaka Ishida | 2013-06-11 |
| 8295584 | Pattern measurement methods and pattern measurement equipment | Ryoichi Matsuoka | 2012-10-23 |
| 8291412 | Method of checking a possibility of executing a virtual machine | Tomoki Sekiguchi | 2012-10-16 |
| 8199191 | Electron microscope for inspecting dimension and shape of a pattern formed on a wafer | Takumichi Sutani, Yutaka Hojo | 2012-06-12 |
| 8181571 | Printing device and printing method | Toshiyuki Kusunoki, Masataka Aiba | 2012-05-22 |
| 8173971 | Sample transfer unit and sample transferring method | Takashi Gunji, Katsuya Kawakami, Hideki Yatabe | 2012-05-08 |
| 8028184 | Device allocation changing method | Tomoki Sekiguchi, Sachie Tajima | 2011-09-27 |
| 7800060 | Pattern measurement method and pattern measurement system | Ryoichi Matsuoka, Takumichi Sutani | 2010-09-21 |
| 7737416 | Sample transfer unit and sample transferring method | Takashi Gunji, Katsuya Kawakami, Hideki Yatabe | 2010-06-15 |
| 7636538 | Layer-thickness restriction member, developing device, method for manufacturing restriction blade, and blade-forming mold | Katsumi Okamoto | 2009-12-22 |
| 7566872 | Scanning electron microscope | Ritsuo Fukaya, Zhigang Wang, Noriaki Arai, Makoto Ezumi | 2009-07-28 |
| 7184142 | Raman probe and Raman spectrum measuring apparatus utilizing the same | Yuichi Komachi, Hideo Tashiro, Katsuo Aizawa | 2007-02-27 |
| 7077281 | Cover mounting structure of waterproof box | Koji Miyakoshi | 2006-07-18 |