Issued Patents All Time
Showing 1–25 of 68 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9196453 | Gas field ionization ion source and ion beam device | Yoshimi Kawanami | 2015-11-24 |
| 8809801 | Gas field ionization ion source and ion beam device | Yoshimi Kawanami | 2014-08-19 |
| 8796651 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Hidemi Koike, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2014-08-05 |
| 8563944 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Noriaki Arai | 2013-10-22 |
| 8530865 | Gas field ion source, charged particle microscope, and apparatus | Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Satoshi Tomimatsu, Tomihiro Hashizume | 2013-09-10 |
| 8263943 | Ion beam device | Hiroyasu Shichi, Shinichi Matsubara, Norihide Saho, Noriaki Arai | 2012-09-11 |
| 8115184 | Gas field ion source, charged particle microscope, and apparatus | Hiroyasu Shichi, Shinichi Matsubara, Takashi Ohshima, Satoshi Tomimatsu, Tomihiro Hashizume | 2012-02-14 |
| 7947964 | Charged particle beam orbit corrector and charged particle beam apparatus | Hiroyuki Ito, Yuko Sasaki, Yoshinori Nakayama | 2011-05-24 |
| 7928377 | Charged particle beam apparatus and sample manufacturing method | Tsuyoshi Ohnishi, Mitsugu Sato, Koichiro Takeuchi | 2011-04-19 |
| 7915581 | Methods for sample preparation and observation, charged particle apparatus | Uki Kabasawa, Tsuyoshi Ohnishi | 2011-03-29 |
| 7897936 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Hidemi Koike, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2011-03-01 |
| 7804073 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Kaoru Umemura | 2010-09-28 |
| 7805023 | Image evaluation method and microscope | Mitsugu Sato, Hideo Todokoro, Tadashi Otaka, Takashi Iizumi, Atsushi Takane | 2010-09-28 |
| 7550740 | Focused ION beam apparatus | Koichiro Takeuchi | 2009-06-23 |
| 7482586 | Methods for sample preparation and observation, charged particle apparatus | Uki Kabasawa, Tsuyoshi Ohnishi | 2009-01-27 |
| 7420181 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Kaoru Umemura | 2008-09-02 |
| 7411192 | Focused ion beam apparatus and focused ion beam irradiation method | Koichiro Takeuchi, Yoichi Ose | 2008-08-12 |
| 7340111 | Image evaluation method and microscope | Mitsugu Sato, Hideo Todokoro, Tadashi Otaka, Takashi Iizumi, Atsushi Takane | 2008-03-04 |
| 7301146 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Aritoshi Sugimoto, Yuichi Hamamura +2 more | 2007-11-27 |
| 7268356 | Method and apparatus for specimen fabrication | Hiroyasu Shichi, Hidemi Koike, Kaoru Umemura, Eiichi Seya, Mitsuo Tokuda +3 more | 2007-09-11 |
| 7236651 | Image evaluation method and microscope | Mitsugu Sato, Hideo Todokoro, Tadashi Otaka, Takashi Iizumi, Atsushi Takane | 2007-06-26 |
| 7235798 | Focused ion beam apparatus | Hiroyuki Muto, Yuichi Madokoro | 2007-06-26 |
| 7211805 | Liquid metal ion gun | Hiroyasu Kaga, Yuichi Madokoro, Shigeru Izawa, Kaoru Umemura | 2007-05-01 |
| 7186975 | Scanning charged-particle microscope | Hideo Todokoro, Mitsugu Sato | 2007-03-06 |
| 7084399 | Ion beam apparatus and sample processing method | Hiroyuki Muto, Yuichi Madokoro | 2006-08-01 |