Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10614391 | Method and apparatus for work quality control | Kei Imazawa, Shigenori Tanaka, Kouichirou Tada, Isamu Momose, Yusaku Fukaya | 2020-04-07 |
| 8995748 | Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method | Tsunehiro Sakai, Shigeki Kurihara, Yutaka Tandai, Tamao Ishikawa, Tomohiro Funakoshi +2 more | 2015-03-31 |
| 8675949 | Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review tool | Yuji Takagi, Minoru Harada | 2014-03-18 |
| 8621400 | Method of evaluating systematic defect, and apparatus therefor | Yuji Takagi | 2013-12-31 |
| 8612811 | Defective-ratio predicting method, defective-ratio predicting program, managing method for semiconductor manufacturing apparatus, and manufacturing method for semiconductor device | Chizu Matsumoto, Yoshiyuki Tsunoda, Kazuyuki Tsunokuni | 2013-12-17 |
| 7945410 | Semiconductor device yield prediction system and method | Natsuyo Morioka, Seiji Ishikawa, Katsumi Ikegaya, Yasunori Yamaguchi, Kazuo Ito | 2011-05-17 |
| 7352890 | Method for analyzing circuit pattern defects and a system thereof | Atsushi Shimoda, Ichirou Ishimaru, Yuji Takagi, Takuo Tamura, Kenji Watanabe +2 more | 2008-04-01 |
| 7301146 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto +2 more | 2007-11-27 |
| 7062081 | Method and system for analyzing circuit pattern defects | Atsushi Shimoda, Ichirou Ishimaru, Yuji Takagi, Takuo Tamura, Kenji Watanabe +2 more | 2006-06-13 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Aritoshi Sugimoto +2 more | 2005-11-01 |
| 6895346 | Method for test conditions | Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni, Aritoshi Sugimoto | 2005-05-17 |
| 6841405 | Photomask for test wafers | Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2005-01-11 |
| 6780660 | System for testing electronic devices | Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2004-08-24 |
| 6770496 | Method of testing electronic devices | Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2004-08-03 |
| 6771077 | Method of testing electronic devices indicating short-circuit | Takaaki Kumazawa, Hisao Asakura, Aritoshi Sugimoto, Kazuyuki Tsunokuni | 2004-08-03 |
| 6476387 | Method and apparatus for observing or processing and analyzing using a charged beam | Norimasa Nishimura, Akira Shimase, Junzou Azuma, Michinobu Mizumura, Yasuhiro Koizumi +1 more | 2002-11-05 |
| 6344115 | Pattern forming method using charged particle beam process and charged particle beam processing system | Junzou Azuma, Akira Shimase, Hidemi Koike | 2002-02-05 |
| 6303932 | Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam | Akira Shimase, Junzou Azuma, Michinobu Mizumura, Norimasa Nishimura, Yasuhiro Koizumi +1 more | 2001-10-16 |
| 5976328 | Pattern forming method using charged particle beam process and charged particle beam processing system | Junzou Azuma, Akira Shimase, Hidemi Koike | 1999-11-02 |
| 5952658 | Method and system for judging milling end point for use in charged particle beam milling system | Akira Shimase, Junzou Azuma, Michinobu Mizumura | 1999-09-14 |