Issued Patents All Time
Showing 25 most recent of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11855318 | Fuel battery cell, fuel battery system, leak detection method | Munenori Degawa, Noriyuki Sakuma, Yoshitaka Sasago, Nobuyuki Mise, Takashi Tsutsumi | 2023-12-26 |
| 11417892 | Fuel cell | Noriyuki Sakuma, Yoshitaka Sasago, Nobuyuki Mise, Seiichi Watanabe | 2022-08-16 |
| 7957579 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Maki Tanaka, Hiroshi Miyai +2 more | 2011-06-07 |
| 7952074 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2011-05-31 |
| 7894658 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Maki Tanaka, Hiroshi Miyai +2 more | 2011-02-22 |
| 7457453 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Maki Tanaka, Hiroshi Miyai +2 more | 2008-11-25 |
| 7417444 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2008-08-26 |
| 7301146 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Yuichi Hamamura +2 more | 2007-11-27 |
| 7266235 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Maki Tanaka, Hiroshi Miyai +2 more | 2007-09-04 |
| 7260256 | Method and system for inspecting a pattern | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Hiroyuki Shinada +2 more | 2007-08-21 |
| 7133550 | Pattern inspection method and apparatus | Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Maki Tanaka, Hiroshi Miyai +2 more | 2006-11-07 |
| 7122796 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2006-10-17 |
| 7026830 | Method and apparatus for inspecting integrated circuit pattern | Hiroyuki Shinada, Mari Nozoe, Haruo Yoda, Kimiaki Ando, Katsuhiro Kuroda +12 more | 2006-04-11 |
| 6970004 | Apparatus for inspecting defects of devices and method of inspecting defects | Tohru Ishitani, Hidemi Koike, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2005-11-29 |
| 6960765 | Probe driving method, and probe apparatus | Satoshi Tomimatsu, Hidemi Koike, Junzo Azuma, Tohru Ishitani, Yuichi Hamamura +2 more | 2005-11-01 |
| 6944325 | Inspecting method and apparatus for repeated micro-miniature patterns | Junichi Taguchi, Masami Ikoto, Yuko Inoue, Tetsuya Watanabe, Wakana Shinke | 2005-09-13 |
| 6895346 | Method for test conditions | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2005-05-17 |
| 6841405 | Photomask for test wafers | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2005-01-11 |
| 6828554 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2004-12-07 |
| 6780660 | System for testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2004-08-24 |
| 6771077 | Method of testing electronic devices indicating short-circuit | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2004-08-03 |
| 6770496 | Method of testing electronic devices | Yuichi Hamamura, Takaaki Kumazawa, Hisao Asakura, Kazuyuki Tsunokuni | 2004-08-03 |
| 6760472 | Identification method for an article using crystal defects | Kazuo Takeda, Takanori Ninomiya | 2004-07-06 |
| 6734687 | Apparatus for detecting defect in device and method of detecting defect | Tohru Ishitani, Hidemi Koike, Isamu Sekihara, Kaoru Umemura, Satoshi Tomimatsu +1 more | 2004-05-11 |
| 6717142 | Electron beam inspection method and apparatus and semiconductor manufacturing method and its manufacturing line utilizing the same | Takashi Hiroi, Maki Tanaka, Masahiro Watanabe, Asahiro Kuni, Yukio Matsuyama +3 more | 2004-04-06 |