TN

Takanori Ninomiya

HI Hitachi: 55 patents #211 of 28,497Top 1%
HH Hitachi High-Technologies: 12 patents #211 of 1,917Top 15%
HS Hitachi Automotive Systems: 4 patents #412 of 1,636Top 30%
SE Seiko Epson: 3 patents #3,864 of 7,774Top 50%
HS Hitachi Computer Products (Europe) S.A.S.: 3 patents #4 of 10Top 40%
HC Hitachi Electronics Engineering Co.: 1 patents #61 of 175Top 35%
HC Hitachi High-Tech Electronics Engineering Co.: 1 patents #11 of 59Top 20%
HA Hitachi Astemo: 1 patents #649 of 1,276Top 55%
Aisin Seiki Kabushiki Kaisha: 1 patents #2,094 of 3,782Top 60%
Overall (All Time): #31,150 of 4,157,543Top 1%
68
Patents All Time

Issued Patents All Time

Showing 1–25 of 68 patents

Patent #TitleCo-InventorsDate
11139748 Power module, power converter device, and electrically powered vehicle Kinya Nakatsu, Hiroshi Hozoji, Takeshi Tokuyama, Yusuke Takagi, Toshiya Satoh +1 more 2021-10-05
10348214 Power module, power converter device, and electrically powered vehicle Kinya Nakatsu, Hiroshi Hozoji, Takeshi Tokuyama, Yusuke Takagi, Toshiya Satoh +1 more 2019-07-09
9729076 Power module, power converter device, and electrically powered vehicle Kinya Nakatsu, Hiroshi Hozoji, Takeshi Tokuyama, Yusuke Takagi, Toshiya Satoh +1 more 2017-08-08
9407163 Power module, power converter device, and electrically powered vehicle Kinya Nakatsu, Hiroshi Hozoji, Takeshi Tokuyama, Yusuke Takagi, Toshiya Satoh +1 more 2016-08-02
8946567 Power module, power converter device, and electrically powered vehicle Kinya Nakatsu, Hiroshi Hozoji, Takeshi Tokuyama, Yusuke Takagi, Toshiya Satoh +1 more 2015-02-03
8590593 Roller shade apparatus for vehicle Takashi Kitani, Yoshitaka Nakamura, Naoto Kamioku 2013-11-26
8559000 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2013-10-15
8274651 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2012-09-25
8132926 Electro-optic device and an electronic apparatus 2012-03-13
8040503 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2011-10-18
7987033 Method for determining the morphology of an occupant in an automotive seat with capacitive sensors Claude Launay, Joaquim Da Silva, Florent Voisin, Tomoaki Hirai, Shunji Maeda 2011-07-26
7962311 Method using capacitive sensors for morphology discrimination of a passenger seating in an automotive seat Claude Launay, Tomoaki Hirai, Joaquim Da Silva, Florent Voisin, Shunji Maeda 2011-06-14
7940383 Method of detecting defects on an object Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more 2011-05-10
7895014 Method for improving the localisation of a target in regard of a sensor Claude Launay, Joaquim Da Silva, Florent Voisin, Tomoaki Hirai, Shunji Maeda 2011-02-22
7864277 Liquid crystal device and projector Hiromi Saito 2011-01-04
7692779 Apparatus and method for testing defects Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more 2010-04-06
7671948 Liquid crystal device and electronic apparatus 2010-03-02
7643138 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2010-01-05
7639350 Apparatus and method for testing defects Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more 2009-12-29
7619414 NMR probe and NMR spectrometer Hiroyuki Yamamoto, Kazuo Saitoh 2009-11-17
7558683 Method for inspecting defect and system therefor Seiji Isogai, Shigeru Matsui, Toshiei Kurosaki 2009-07-07
7443496 Apparatus and method for testing defects Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Shunichi Matsumoto, Yukio Kembo +7 more 2008-10-28
7417723 Method of inspecting a semiconductor device and an apparatus thereof Akira Hamamatsu, Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka +4 more 2008-08-26
7397031 Method of inspecting a circuit pattern and inspecting instrument Hiroyuki Shinada, Atsuko Takafuji, Yuko Sasaki, Mari Nozoe, Hisaya Murakoshi +5 more 2008-07-08
7305314 Method for inspecting defect and system therefor Seiji Isogai, Shigeru Matsui, Toshiei Kurosaki 2007-12-04