Issued Patents All Time
Showing 1–25 of 84 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11442024 | Defect classification device, inspection device, and inspection system | Takanori Kondo, Toshifumi Honda, Hideo Ota, Yoshio Kimoto | 2022-09-13 |
| 11346791 | Inspection device and inspection method thereof | Masami Makuuchi, Toshifumi Honda, Nobuhiro Obara, Shunichi Matsumoto | 2022-05-31 |
| 11143600 | Defect inspection device | Toshifumi Honda, Masami Makuuchi, Shunichi Matsumoto, Nobuhiro Obara | 2021-10-12 |
| 10401304 | Examination device | Masami Makuuchi, Kazuma Ogawa | 2019-09-03 |
| 10261027 | Inspection device | Yoshio Kimoto | 2019-04-16 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2019-04-09 |
| 10107762 | Examination device | Masami Makuuchi, Kazuma Ogawa | 2018-10-23 |
| 9841384 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2017-12-12 |
| 9645094 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Takahiro Jingu | 2017-05-09 |
| 9588055 | Defect inspection apparatus and defect inspection method | Yuta Urano, Taketo Ueno, Toshifumi Honda | 2017-03-07 |
| 9568437 | Inspection device | Shunichi Matsumoto, Takahiro Jingu | 2017-02-14 |
| 9568439 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Takahiro Jingu | 2017-02-14 |
| 9354049 | Shape measurement method, and system therefor | Chie Shishido, Maki Tanaka, Atsushi Miyamoto, Manabu Yano | 2016-05-31 |
| 9329136 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Takahiro Jingu | 2016-05-03 |
| 9228960 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2016-01-05 |
| 8831899 | Inspecting apparatus and an inspecting method | Kazunori Nemoto, Hideo Ota, Kenji Oka, Takahiro Jingu | 2014-09-09 |
| 8755041 | Defect inspection method and apparatus | Yuta Urano, Shunji Maeda, Kaoru Sakai | 2014-06-17 |
| 8660340 | Defect classification method and apparatus, and defect inspection apparatus | Hisae Shibuya, Shunji Maeda | 2014-02-25 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2014-02-18 |
| 8643834 | Apparatus of inspecting defect in semiconductor and method of the same | Shunji Maeda, Hisae Shibuya | 2014-02-04 |
| 8638429 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2014-01-28 |
| 8559000 | Method of inspecting a semiconductor device and an apparatus thereof | Minori Noguchi, Yoshimasa Ohshima, Hidetoshi Nishiyama, Kenji Oka, Takanori Ninomiya +4 more | 2013-10-15 |
| 8508727 | Defects inspecting apparatus and defects inspecting method | Sachio Uto, Minori Noguchi, Hidetoshi Nishiyama, Yoshimasa Ohshima, Takahiro Jingu +2 more | 2013-08-13 |
| 8477302 | Defect inspection apparatus | Yuta Urano, Toshiyuki Nakao, Yoshimasa Oshima | 2013-07-02 |
| 8462330 | Method and apparatus for detecting defects | Hiroyuki Nakano, Toshihiko Nakata, Sachio Uto, Shunji Maeda, Yuta Urano | 2013-06-11 |