Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11781861 | Surface measurement method, component manufacturing method, component inspection method, and component measurement device | Jeremy JONG, Kazushi Miyata | 2023-10-10 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Akira Hamamatsu, Yuta Urano | 2019-04-09 |
| 9841384 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Akira Hamamatsu, Yuta Urano | 2017-12-12 |
| 9228960 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Akira Hamamatsu, Yuta Urano | 2016-01-05 |
| 9041921 | Defect inspection device and defect inspection method | Toshiyuki Nakao, Yuta Urano, Toshifumi Honda | 2015-05-26 |
| 8804110 | Fault inspection device and fault inspection method | Yuta Urano, Toshiyuki Nakao, Toshifumi Honda, Yukihiro Shibata | 2014-08-12 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano +1 more | 2014-02-18 |
| 8638429 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Akira Hamamatsu, Yuta Urano | 2014-01-28 |
| 8599369 | Defect inspection device and inspection method | Yuta Urano, Toshiyuki Nakao, Toshifumi Honda | 2013-12-03 |
| 8514388 | Flaw inspecting method and device therefor | Toshifumi Honda, Toshiyuki Nakao, Yuta Urano | 2013-08-20 |
| 8310665 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano +1 more | 2012-11-13 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano +1 more | 2012-03-27 |
| 8089614 | Device for changing pitch between light beam axes, and substrate exposure apparatus | Yoshitada Oshida, Yoshitatsu Naito, Mituhiro Suzuki, Tsuyoshi Yamaguchi | 2012-01-03 |
| 7498589 | Scanning probe microscope | Mineo Nomoto, Toru Kurenuma, Yuichi Kunitomo, Yukio Kembo | 2009-03-03 |
| 7215886 | Optical communication module | Kazumi Kawamoto, Hiroaki Furuichi, Tooru Yoshida, Isamu Yoshida, Katsuya Oono +6 more | 2007-05-08 |
| 6693699 | Image display device and its repairing method and apparatus | Takashi Inoue, Toshio Asano, Susumu Aiuchi, Takeo Sawaguchi, Rokuro Watanabe | 2004-02-17 |
| 6552771 | Image display device and its repairing method and apparatus | Takashi Inoue, Toshio Asano, Susumu Aiuchi, Takeo Sawaguchi, Rokuro Watanabe | 2003-04-22 |
| 5883437 | Method and apparatus for inspection and correction of wiring of electronic circuit and for manufacture thereof | Mikio Hongo, Satoru Todoroki, Masaaki Okunaka, Hideo Matsuzaki, Takanori Ninomiya +2 more | 1999-03-16 |
| 5832595 | Method of modifying conductive lines of an electronic circuit board and its apparatus | Mikio Hongo, Haruhisa Sakamoto, Tateoki Miyauchi, Ryohei Satoh, Kiyoshi Matsui +3 more | 1998-11-10 |
| 5229569 | Laser machining apparatus and method of the same | Tateoki Miyauchi, Katsurou Mizukoshi, Mikio Hongo, Koyo Morita, Kaoru Katayama +3 more | 1993-07-20 |
| 5208437 | Method of cutting interconnection pattern with laser and apparatus thereof | Tateoki Miyauchi, Mikio Hongo, Katsurou Mizukoshi, Hiroshi Yamaguchi, Koyo Morita | 1993-05-04 |