Issued Patents All Time
Showing 1–25 of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12043916 | Quartz glass crucible with crystallization-accelerator-containing layer having gradient concentration | Hiroshi Kishi, Kouta Hasebe, Hideki Fujiwara | 2024-07-23 |
| 10352879 | X-ray inspection method and device | Yuta Urano, Kaifeng Zhang, Hideaki Sasazawa | 2019-07-16 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2019-04-09 |
| 9841384 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2017-12-12 |
| 9506872 | Inspection apparatus | Yoshimasa Oshima, Yuta Urano | 2016-11-29 |
| 9228960 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2016-01-05 |
| 9041921 | Defect inspection device and defect inspection method | Shigenobu Maruyama, Yuta Urano, Toshifumi Honda | 2015-05-26 |
| 8958062 | Defect inspection method and device using same | Yukihiro Shibata, Yuta Urano, Toshifumi Honda | 2015-02-17 |
| 8934092 | Surface defect inspection method and apparatus | Yoshimasa Oshima, Shigeru Matsui | 2015-01-13 |
| 8804110 | Fault inspection device and fault inspection method | Yuta Urano, Shigenobu Maruyama, Toshifumi Honda, Yukihiro Shibata | 2014-08-12 |
| 8711347 | Defect inspection method and device therefor | Toshifumi Honda, Yuta Urano, Yukihiro Shibata | 2014-04-29 |
| 8705026 | Inspection apparatus | Yoshimasa Oshima, Yuta Urano | 2014-04-22 |
| 8670116 | Method and device for inspecting for defects | Junguo Xu, Yuki Shimizu, Toshihiko Nakata, Toshifumi Honda, Yukihiro Shibata +1 more | 2014-03-11 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano +1 more | 2014-02-18 |
| 8638429 | Defect inspecting method and defect inspecting apparatus | Shigenobu Maruyama, Akira Hamamatsu, Yuta Urano | 2014-01-28 |
| 8599369 | Defect inspection device and inspection method | Yuta Urano, Shigenobu Maruyama, Toshifumi Honda | 2013-12-03 |
| 8514388 | Flaw inspecting method and device therefor | Shigenobu Maruyama, Toshifumi Honda, Yuta Urano | 2013-08-20 |
| 8482727 | Defect inspection method | Yoshimasa Oshima, Yuta Urano | 2013-07-09 |
| 8477302 | Defect inspection apparatus | Yuta Urano, Yoshimasa Oshima, Akira Hamamatsu | 2013-07-02 |
| 8400629 | Surface defect inspection method and apparatus | Yoshimasa Oshima, Shigeru Matsui | 2013-03-19 |
| 8314929 | Method and its apparatus for inspecting defects | Yuta Urano, Yoshimasa Oshima | 2012-11-20 |
| 8310665 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano +1 more | 2012-11-13 |
| 8264679 | Inspection apparatus | Yoshimasa Oshima, Yuta Urano | 2012-09-11 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Yoshimasa Oshima, Shunji Maeda, Hisae Shibuya, Yuta Urano +1 more | 2012-03-27 |
| 8120766 | Inspection apparatus | Yoshimasa Oshima, Yuta Urano | 2012-02-21 |