Issued Patents All Time
Showing 1–25 of 80 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400889 | Defect inspection device | Hiromichi Yamakawa, Toshifumi Honda, Shunichi Matsumoto, Masaya Yamamoto, Eiji Arima | 2025-08-26 |
| 12366538 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Eiji Arima, Hiromichi Yamakawa, Shunichi Matsumoto, Hisaaki Kanai | 2025-07-22 |
| 12345654 | Defect inspection device, defect inspection method, and adjustment substrate | Eiji Arima, Hiromichi Yamakawa, Toshifumi Honda | 2025-07-01 |
| 12313566 | Defect inspection device and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Hisaaki Kanai | 2025-05-27 |
| 12025569 | Defect inspection device and inspection method, and optical module | Toshifumi Honda, Shunichi Matsumoto, Eiji Arima | 2024-07-02 |
| 11982631 | Defect detection device, defect detection method, and defect observation apparatus including defect detection device | Yuko Otani, Kazuo Aoki, Shunichi Matsumoto | 2024-05-14 |
| 11644545 | Distance measuring device, distance measuring method, and three-dimensional shape measuring apparatus | Kenji MARUNO, Masahiro Watanabe, Tatsuo Hariyama, Atsushi Taniguchi | 2023-05-09 |
| 11143598 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Masami Makuuchi, Keiko Oka | 2021-10-12 |
| 10955361 | Defect inspection apparatus and pattern chip | Toshifumi Honda, Akio Yazaki, Yukihiro Shibata, Hideki Fukushima, Yasuhiro Yoshitake | 2021-03-23 |
| 10948424 | Defect inspection device, pattern chip, and defect inspection method | Yukihiro Shibata, Toshifumi Honda, Yasuhiro Yoshitake, Hideki Fukushima | 2021-03-16 |
| 10830706 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Masami Makuuchi, Keiko Oka | 2020-11-10 |
| 10823686 | X-ray inspection method and X-ray inspection device | Kaifeng Zhang, Yoshiki Matoba, Akihiro Takeda | 2020-11-03 |
| 10663844 | Projection control apparatus and control method thereof, and projection system | Kensuke Inagaki, Makiko Mori | 2020-05-26 |
| 10401300 | Defect observation method and device and defect detection device | Yuko Otani, Toshifumi Honda | 2019-09-03 |
| 10352879 | X-ray inspection method and device | Toshiyuki Nakao, Kaifeng Zhang, Hideaki Sasazawa | 2019-07-16 |
| 10261026 | Defect inspection method, low light detecting method, and low light detector | Toshifumi Honda, Takahiro Jingu | 2019-04-16 |
| 10254235 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2019-04-09 |
| 10228332 | Defect inspection device and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Taketo Ueno, Yuko Otani | 2019-03-12 |
| 9841384 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2017-12-12 |
| 9773641 | Method and apparatus for observing defects | Yuko Otani, Toshifumi Honda | 2017-09-26 |
| 9733194 | Method for reviewing a defect and apparatus | Yuko Otani, Shunji Maeda, Toshifumi Honda, Takehiro Hirai, Satoru Takahashi +1 more | 2017-08-15 |
| 9678021 | Method and apparatus for inspecting defects | Toshifumi Honda | 2017-06-13 |
| 9645094 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Jingu, Akira Hamamatsu | 2017-05-09 |
| 9606071 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Toshifumi Honda | 2017-03-28 |
| 9588055 | Defect inspection apparatus and defect inspection method | Taketo Ueno, Akira Hamamatsu, Toshifumi Honda | 2017-03-07 |