Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400889 | Defect inspection device | Hiromichi Yamakawa, Toshifumi Honda, Yuta Urano, Shunichi Matsumoto, Masaya Yamamoto | 2025-08-26 |
| 12366538 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Yuta Urano, Hiromichi Yamakawa, Shunichi Matsumoto, Hisaaki Kanai | 2025-07-22 |
| 12345654 | Defect inspection device, defect inspection method, and adjustment substrate | Yuta Urano, Hiromichi Yamakawa, Toshifumi Honda | 2025-07-01 |
| 12146840 | Defect inspection device | Toshifumi Honda, Shunichi Matsumoto | 2024-11-19 |
| 12025569 | Defect inspection device and inspection method, and optical module | Toshifumi Honda, Shunichi Matsumoto, Yuta Urano | 2024-07-02 |