SM

Shunichi Matsumoto

HH Hitachi High-Technologies: 34 patents #98 of 1,917Top 6%
HI Hitachi: 19 patents #1,906 of 28,497Top 7%
MC Mitsubishi Gas Chemical Company: 7 patents #273 of 1,727Top 20%
PC Pi R&D Co.: 6 patents #4 of 41Top 10%
NI Nomura Research Institute: 4 patents #4 of 109Top 4%
TL Tokyo Electron Limited: 4 patents #1,723 of 5,567Top 35%
Ricoh Company: 3 patents #4,826 of 9,818Top 50%
HD Hitachi Displays: 2 patents #384 of 752Top 55%
HC Hitachi Device Engineering Co.: 1 patents #292 of 514Top 60%
HC Hitachi Electronics Engineering Co.: 1 patents #61 of 175Top 35%
IT Ips Alpha Technology: 1 patents #13 of 27Top 50%
CC Cj Cheiljedang: 1 patents #489 of 827Top 60%
RE Renesas Electronics: 1 patents #2,739 of 4,529Top 65%
Overall (All Time): #24,250 of 4,157,543Top 1%
77
Patents All Time

Issued Patents All Time

Showing 1–25 of 77 patents

Patent #TitleCo-InventorsDate
12400889 Defect inspection device Hiromichi Yamakawa, Toshifumi Honda, Yuta Urano, Masaya Yamamoto, Eiji Arima 2025-08-26
12366538 Defect inspection apparatus and defect inspection method Toshifumi Honda, Yuta Urano, Eiji Arima, Hiromichi Yamakawa, Hisaaki Kanai 2025-07-22
12345661 Defect inspection apparatus and defect inspection method Toshifumi Honda, Nobuhiro Obara 2025-07-01
12313566 Defect inspection device and defect inspection method Toshifumi Honda, Yuta Urano, Hisaaki Kanai 2025-05-27
12146840 Defect inspection device Eiji Arima, Toshifumi Honda 2024-11-19
12085517 Lighting optical system and substrate inspecting device Akihiro Iwamatsu, Masaya Yamamoto 2024-09-10
12044627 Defect inspection device and defect inspection method Masaya Yamamoto, Toshifumi Honda, Masami Makuuchi, Nobuhiro Obara 2024-07-23
12025569 Defect inspection device and inspection method, and optical module Toshifumi Honda, Eiji Arima, Yuta Urano 2024-07-02
11982631 Defect detection device, defect detection method, and defect observation apparatus including defect detection device Yuko Otani, Kazuo Aoki, Yuta Urano 2024-05-14
11828522 Cryogenic refrigerator and biomagnetic measurement apparatus Jun Kondo, Kunio Kazami, Hiroshi Kubota, Takahiro Umeno, Syoji Takami +1 more 2023-11-28
11580011 Operation verifying apparatus, operation verifying method and operation verifying system Mamoru Yasuda, Takaya Higashino, Eiji Nabika, Hayato Takabatake, Takuma Ishibashi +1 more 2023-02-14
11346791 Inspection device and inspection method thereof Masami Makuuchi, Toshifumi Honda, Nobuhiro Obara, Akira Hamamatsu 2022-05-31
11143598 Defect inspection apparatus and defect inspection method Toshifumi Honda, Masami Makuuchi, Yuta Urano, Keiko Oka 2021-10-12
11143600 Defect inspection device Toshifumi Honda, Masami Makuuchi, Akira Hamamatsu, Nobuhiro Obara 2021-10-12
11047805 Inspection device and detector 2021-06-29
10918293 Magnetic measuring apparatus Takumi Yamaga, Hiroshi Deguchi, Koji Yamaguchi, Takafumi Ishibe, Shigenori Kawabata +1 more 2021-02-16
10860463 Operation verifying apparatus, operation verifying method and operation verifying system Mamoru Yasuda, Takaya Higashino, Eiji Nabika, Hayato Takabatake, Takuma Ishibashi +1 more 2020-12-08
10830706 Defect inspection apparatus and defect inspection method Toshifumi Honda, Masami Makuuchi, Yuta Urano, Keiko Oka 2020-11-10
10722701 Nerve stimulation apparatus and biomagnetic field measurement system Takafumi Ishibe, Shigenori Kawabata, Takumi Yamaga, Hiroshi Deguchi, Koji Yamaguchi 2020-07-28
10346288 Operation verifying apparatus, operation verifying method and operation verifying system Mamoru Yasuda, Takaya Higashino, Eiji Nabika, Hayato Takabatake, Takuma Ishibashi +1 more 2019-07-09
10267745 Defect detection method and defect detection device and defect observation device provided with same Yuko Otani, Takehiro Tachizaki, Masahiro Watanabe 2019-04-23
10228332 Defect inspection device and defect inspection method Toshifumi Honda, Yuta Urano, Taketo Ueno, Yuko Otani 2019-03-12
9759666 Defect detection method and defect detection device and defect observation device provided with same Yuko Otani, Takehiro Tachizaki, Masahiro Watanabe 2017-09-12
9568437 Inspection device Akira Hamamatsu, Takahiro Jingu 2017-02-14
9535013 Method and apparatus for inspecting defect Taketo Ueno, Atsushi Taniguchi 2017-01-03