Issued Patents All Time
Showing 1–25 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422377 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Takanori Kondo, Nobuhiro Obara | 2025-09-23 |
| 12276618 | Defect inspection device | Kazuhide Sato, Yukihisa Mohara | 2025-04-15 |
| 12044627 | Defect inspection device and defect inspection method | Masaya Yamamoto, Toshifumi Honda, Nobuhiro Obara, Shunichi Matsumoto | 2024-07-23 |
| 11346791 | Inspection device and inspection method thereof | Toshifumi Honda, Nobuhiro Obara, Shunichi Matsumoto, Akira Hamamatsu | 2022-05-31 |
| 11199511 | Medium sensor device and monitoring system | Kazuki Ikeda, Shinichi Murakami, Ryo Kadoi, Tomoharu NAGASHIMA | 2021-12-14 |
| 11143600 | Defect inspection device | Toshifumi Honda, Shunichi Matsumoto, Akira Hamamatsu, Nobuhiro Obara | 2021-10-12 |
| 11143598 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Yuta Urano, Keiko Oka | 2021-10-12 |
| 10830706 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Yuta Urano, Keiko Oka | 2020-11-10 |
| 10458924 | Inspection apparatus and inspection method | Hisaaki Kanai, Yukihisa Mohara, Eiji Imai | 2019-10-29 |
| 10401304 | Examination device | Kazuma Ogawa, Akira Hamamatsu | 2019-09-03 |
| 10107762 | Examination device | Kazuma Ogawa, Akira Hamamatsu | 2018-10-23 |
| 9779912 | Inspection device and measurement device | Takahiro Jingu | 2017-10-03 |
| 9698783 | Driver integrated circuit | Wen Li, Norio Chujo, Takehito Kamimura | 2017-07-04 |
| 9576769 | Weak signal detection system and electron microscope equipped with same | Hisaaki Kanai, Wen Li | 2017-02-21 |
| 9261475 | Inspection equipment and inspection method | Minori Noguchi, Hiroshi Kawaguchi | 2016-02-16 |
| 8908171 | Defect inspection method and defect inspection device | Takahiro Jingu | 2014-12-09 |
| 8563925 | Mass spectroscope and its adjusting method | Hisaaki Kanai, Fujio Ohnishi | 2013-10-22 |
| 8451063 | Wideband low noise sensor amplifier circuit | Masayoshi Takahashi, Norio Chujo | 2013-05-28 |
| 8035071 | Contamination-inspecting apparatus and detection circuit | Ritsurou Orihashi, Masayoshi Takahashi, Wen Li, Kengo Imagawa, Takahiro Jingu | 2011-10-11 |
| 8000045 | Inspection apparatus and inspection method of magnetic disk or magnetic head | Masayoshi Takahashi, Yoshihiro Sakurai, Hideki Mochizuki | 2011-08-16 |
| 8000047 | Inspection apparatus and inspection method of magnetic disk or magnetic head | Masayoshi Takahashi, Shinji Homma, Yoshihiro Sakurai | 2011-08-16 |
| 7990529 | Detection circuit and foreign matter inspection apparatus for semiconductor wafer | Ritsuro Orihashi, Takahiro Jingu | 2011-08-02 |
| 7668027 | Semiconductor device, testing and manufacturing methods thereof | Kengo Imagawa, Ritsuro Orihashi, Yoshiharu Ikeda, Koichiro Eguchi | 2010-02-23 |
| 7474290 | Semiconductor device and testing method thereof | Norio Chujo, Kengo Imagawa, Ritsuro Orihashi, Yoshitomo Arai | 2009-01-06 |
| 7443373 | Semiconductor device and the method of testing the same | Kengo Imagawa, Norio Chujo, Ritsuro Orihashi, Yoshitomo Arai | 2008-10-28 |