Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12316277 | Low power mode control module and method for crystal oscillator, and circuit using the same | — | 2025-05-27 |
| 11721252 | Control circuit and display device | Ta-Chin CHIU, Tu-Yiin Chang | 2023-08-08 |
| 10684314 | System and method for testing reference voltage circuit | Te-Ming Tseng, Yeh-Tai Hung | 2020-06-16 |
| 10634697 | High-sensitivity sensor system, detection circuit, and detection method | Hisaaki Kanai, Takashi Ooshima | 2020-04-28 |
| 10606331 | Microcontroller unit and protection method for EFT events | — | 2020-03-31 |
| 10063277 | Clock control circuit, demodulation device and spread spectrum method | Atsushi Nakamura, Masahiro TOYAMA, Masafumi Watanabe, Kota Toida, Aya Ohmae | 2018-08-28 |
| 10031170 | Electromagnetic wave measuring apparatus and electromagnetic wave measuring method | Aya Ohmae | 2018-07-24 |
| 9989984 | Reference voltage circuit | Te-Ming Tseng, Wei-Chan Hsu, Yeh-Tai Hung | 2018-06-05 |
| 9729194 | Clock control circuit, demodulation device and spread spectrum method | Atsushi Nakamura, Masahiro TOYAMA, Masafumi Watanabe, Kota Toida, Aya Ohmae | 2017-08-08 |
| 9698783 | Driver integrated circuit | Norio Chujo, Masami Makuuchi, Takehito Kamimura | 2017-07-04 |
| 9576769 | Weak signal detection system and electron microscope equipped with same | Hisaaki Kanai, Masami Makuuchi | 2017-02-21 |
| 8917114 | Voltage detection circuit | — | 2014-12-23 |
| 8035071 | Contamination-inspecting apparatus and detection circuit | Masami Makuuchi, Ritsurou Orihashi, Masayoshi Takahashi, Kengo Imagawa, Takahiro Jingu | 2011-10-11 |
| 7817362 | Inspection apparatus and inspection method of magnetic disk or magnetic head | Masayoshi Takahashi, Ritsuro Orihashi, Shinji Homma | 2010-10-19 |
| 7639021 | Circuit and method for detecting a dielectric breakdown fault | Edward Li, Mark D. Gunderson | 2009-12-29 |
| 6850458 | Controlling data strobe output | — | 2005-02-01 |