Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12408895 | Ultrasound probe and ultrasound diagnostic apparatus | Tsuneo Kawamata, Takayuki Iwashita | 2025-09-09 |
| 11921241 | Ultrasonic probe and ultrasonic diagnostic apparatus using thereon | Yutaka Igarashi, Shinya Kajiyama | 2024-03-05 |
| 11844653 | Probe and ultrasound diagnostic device using the same | Yutaka Igarashi, Shinya Kajiyama, Yoshihiro Hayashi | 2023-12-19 |
| 11660076 | Ultrasonic probe, ultrasonic diagnostic apparatus, and ultrasonic transmission/reception switching method | Shinya Kajiyama, Yoshihiro Hayashi | 2023-05-30 |
| 11357476 | Ultrasonic diagnostic apparatus and probe used for the same | Yutaka Igarashi, Shinya Kajiyama, Yohei Nakamura, Kazuhiro Amino, Takayuki Iwashita | 2022-06-14 |
| 11331693 | Ultrasonic transducer array and ultrasonic probe | Hiroaki Hasegawa, Shuntaro Machida, Taiichi Takezaki | 2022-05-17 |
| 11191527 | Ultrasonic diagnostic apparatus and probe used for the same | Yutaka Igarashi, Shinya Kajiyama, Yohei Nakamura, Kazuhiro Amino, Takayuki Iwashita | 2021-12-07 |
| 10799213 | Ultrasound probe, element circuit thereof, and ultrasound diagnostic device using same | Takuma Nishimoto, Yutaka Igarashi, Toru Yazaki, Yusaku Katsube | 2020-10-13 |
| 10499885 | Ultrasound system and method, and ultrasound probe | Yutaka Igarashi, Toru Yazaki | 2019-12-10 |
| 10448923 | Amplifier circuit and ultrasonic probe | Takuma Nishimoto, Yutaka Igarashi, Yusaku Katsube | 2019-10-22 |
| 8035071 | Contamination-inspecting apparatus and detection circuit | Masami Makuuchi, Ritsurou Orihashi, Masayoshi Takahashi, Wen Li, Takahiro Jingu | 2011-10-11 |
| 7816955 | Ramp generator and circuit pattern inspection apparatus using the same ramp generator | Masayoshi Takahashi, Norio Chujo | 2010-10-19 |
| 7668027 | Semiconductor device, testing and manufacturing methods thereof | Masami Makuuchi, Ritsuro Orihashi, Yoshiharu Ikeda, Koichiro Eguchi | 2010-02-23 |
| 7474290 | Semiconductor device and testing method thereof | Masami Makuuchi, Norio Chujo, Ritsuro Orihashi, Yoshitomo Arai | 2009-01-06 |
| 7443373 | Semiconductor device and the method of testing the same | Masami Makuuchi, Norio Chujo, Ritsuro Orihashi, Yoshitomo Arai | 2008-10-28 |
| 7358953 | Semiconductor device and testing method of semiconductor device | Masami Makuuchi, Norio Chujo, Ritsuro Orihashi, Yoshitomo Arai, Atsushi Obuchi | 2008-04-15 |
| 6774680 | Comparator including a differential transistor pair and a diode arrangement | Norio Chujo, Kaoru Arita, Yoshiharu Umemura, Masahiro Imanari | 2004-08-10 |