Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8779791 | Method of manufacturing probe having boards connected by magnets | Katsushi Sugai | 2014-07-15 |
| 8598902 | Probe, electronic device test apparatus, and method of producing the same | Kensuke Kato, Yoshirou Nakata, Naomi Miyake | 2013-12-03 |
| 8513962 | Wafer tray and test apparatus | Toshiyuki Kiyokawa | 2013-08-20 |
| 8427187 | Probe wafer, probe device, and testing system | Yoshio Komoto | 2013-04-23 |
| 8410807 | Test system and probe apparatus | Yoshio Komoto | 2013-04-02 |
| 8289040 | Test wafer unit and test system | Yoshio Komoto, Shinichi Hamaguchi, Yasushi Kawaguchi | 2012-10-16 |
| 8134379 | Probe wafer, probe device, and testing system | Yoshio Komoto | 2012-03-13 |
| 7389190 | Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus | Toshiyuki Okayasu, Toshiaki Awaji, Masahiro Yamakawa | 2008-06-17 |
| 7342407 | Temperature compensation circuit and testing apparatus | Yuji Kuwana, Takashi Sekino | 2008-03-11 |
| 7208982 | Sampling circuit | Masahiro Yamakawa, Toshiaki Awaji, Satoshi Shiwa | 2007-04-24 |
| 6774680 | Comparator including a differential transistor pair and a diode arrangement | Kengo Imagawa, Norio Chujo, Kaoru Arita, Masahiro Imanari | 2004-08-10 |