Issued Patents All Time
Showing 1–25 of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8115520 | Driver circuit | Naoki Matsumoto | 2012-02-14 |
| 7990177 | Driver circuit for producing signal simulating transmission loss | Naoki Matsumoto, Takayuki Nakamura | 2011-08-02 |
| 7962110 | Driver circuit and test apparatus | Kensuke Kamo, Toshiaki Awaji | 2011-06-14 |
| 7902835 | Transmission line driving circuit | Takayuki Nakamura | 2011-03-08 |
| 7876120 | Test apparatus, pin electronics card, electrical device and switch | Toshiaki Awaji, Masakazu Ando | 2011-01-25 |
| 7808291 | Jitter generating circuit | Takayuki Nakamura | 2010-10-05 |
| 7800912 | Signal transfer system, signal output circuit board, signal receiving circuit board, signal output method, and signal receiving method | Takayuki Nakamura | 2010-09-21 |
| 7755377 | Driver circuit and test apparatus | Kensuke Kamo, Toshiaki Awaji | 2010-07-13 |
| 7707484 | Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted data | Toshiaki Awaji, Takayuki Nakamura | 2010-04-27 |
| 7692441 | Test apparatus and pin electronics card | Naoki Matsumoto | 2010-04-06 |
| 7679390 | Test apparatus and pin electronics card | Naoki Matsumoto | 2010-03-16 |
| 7589549 | Driver circuit and test apparatus | Kensuke Kamo, Toshiaki Awaji | 2009-09-15 |
| 7557561 | Electronic device, circuit and test apparatus | Toshiaki Awaji, Takayuki Nakamura | 2009-07-07 |
| 7538582 | Driver circuit, test apparatus and adjusting method | Naoki Matsumoto, Toshiaki Awaji | 2009-05-26 |
| 7528637 | Driver circuit | Naoki Matsumoto | 2009-05-05 |
| 7512872 | Test apparatus and test method | Toshiaki Awaji, Takayuki Nakamura | 2009-03-31 |
| 7459897 | Terminator circuit, test apparatus, test head, and communication device | Toshiaki Awaji | 2008-12-02 |
| 7453932 | Test device and setting method | Toshiaki Awaji | 2008-11-18 |
| 7394238 | High frequency delay circuit and test apparatus | Katsumi Ochiai | 2008-07-01 |
| 7342407 | Temperature compensation circuit and testing apparatus | Yuji Kuwana, Yoshiharu Umemura | 2008-03-11 |
| 7123025 | Differential comparator circuit, test head, and test apparatus | Toshiaki Awaji | 2006-10-17 |
| 7013230 | Input-output circuit and a testing apparatus | — | 2006-03-14 |
| 6749279 | Inkjet recording device capable of controlling ejection timing of each nozzle individually | Shinya Kobayashi, Eiichi Toyama, Hitoshi Kida, Kunio Satou, Susumu Saito | 2004-06-15 |
| 6678478 | Correcting method of optical signal transmission system and optical signal transmission system using said correcting method | Atsushi Ono | 2004-01-13 |
| 6462598 | Delay time control circuit | Toshiyuki Okayasu | 2002-10-08 |