Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7965092 | Differential signal transmitting apparatus and a test apparatus | Takayuki Nakamura | 2011-06-21 |
| 7962110 | Driver circuit and test apparatus | Kensuke Kamo, Takashi Sekino | 2011-06-14 |
| 7876120 | Test apparatus, pin electronics card, electrical device and switch | Takashi Sekino, Masakazu Ando | 2011-01-25 |
| 7755377 | Driver circuit and test apparatus | Kensuke Kamo, Takashi Sekino | 2010-07-13 |
| 7707484 | Test apparatus and test method with features of adjusting phase difference between data and reference clock and acquiring adjusted data | Takashi Sekino, Takayuki Nakamura | 2010-04-27 |
| 7589549 | Driver circuit and test apparatus | Kensuke Kamo, Takashi Sekino | 2009-09-15 |
| 7557561 | Electronic device, circuit and test apparatus | Takashi Sekino, Takayuki Nakamura | 2009-07-07 |
| 7538582 | Driver circuit, test apparatus and adjusting method | Naoki Matsumoto, Takashi Sekino | 2009-05-26 |
| 7512872 | Test apparatus and test method | Takashi Sekino, Takayuki Nakamura | 2009-03-31 |
| 7459897 | Terminator circuit, test apparatus, test head, and communication device | Takashi Sekino | 2008-12-02 |
| 7453932 | Test device and setting method | Takashi Sekino | 2008-11-18 |
| 7389190 | Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus | Yoshiharu Umemura, Toshiyuki Okayasu, Masahiro Yamakawa | 2008-06-17 |
| 7208982 | Sampling circuit | Masahiro Yamakawa, Yoshiharu Umemura, Satoshi Shiwa | 2007-04-24 |
| 7123025 | Differential comparator circuit, test head, and test apparatus | Takashi Sekino | 2006-10-17 |
| 6257933 | Connector | — | 2001-07-10 |
| 5699001 | Driver circuit for semiconductor test system | Masakazu Ando | 1997-12-16 |
| 5654655 | Driver circuit for semiconductor test system | Masakazu Ando | 1997-08-05 |