Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8659312 | Probe card and semiconductor wafer inspection method using the same | Yoshirou Nakata | 2014-02-25 |
| 8598902 | Probe, electronic device test apparatus, and method of producing the same | Yoshiharu Umemura, Kensuke Kato, Yoshirou Nakata | 2013-12-03 |
| 7673205 | Semiconductor IC and testing method thereof | Yoshirou Nakata | 2010-03-02 |
| 7589546 | Inspection apparatus and method for semiconductor IC | Yoshiro Nakata | 2009-09-15 |
| 5953264 | Redundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block address | Hiroshige Hirano, Hisakazu Kotani | 1999-09-14 |
| 5740114 | Redundant memory cell selecting circuit having fuses coupled to memory cell group address and memory cell block address | Hiroshige Hirano, Hisakazu Kotani | 1998-04-14 |
| 5523710 | Initial value setting circuit | Makoto Kojima | 1996-06-04 |
| 5448159 | Reference voltage generator | Makoto Kojima, Tatsumi Sumi | 1995-09-05 |
| 5282165 | Random access memory with redundancy repair circuit | Tatsumi Sumi | 1994-01-25 |