Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8659312 | Probe card and semiconductor wafer inspection method using the same | Naomi Miyake | 2014-02-25 |
| 8638118 | Wafer inspection device | Satoshi Sasaki | 2014-01-28 |
| 8598902 | Probe, electronic device test apparatus, and method of producing the same | Yoshiharu Umemura, Kensuke Kato, Naomi Miyake | 2013-12-03 |
| 8400182 | Wafer inspection device and semiconductor wafer inspection method using the same | Satoshi Sasaki | 2013-03-19 |
| 7982482 | Probe card, method of manufacturing the probe card and alignment method | Kenji Yamada | 2011-07-19 |
| 7768285 | Probe card for semiconductor IC test and method of manufacturing the same | Minoru Sanada | 2010-08-03 |
| 7673205 | Semiconductor IC and testing method thereof | Naomi Miyake | 2010-03-02 |
| 7589543 | Probe card having a conductive thin film on the surface of an insulating film behind each of the alignment marks each marks comprises a plurality of second bumps | Kenji Yamada | 2009-09-15 |
| 7170189 | Semiconductor wafer and testing method therefor | Masao Takahashi, Tadaaki Mimura, Toshihiko Sakashita, Toshiyuki Fukuda | 2007-01-30 |
| 6323663 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Shin Hashimoto, Yukiharu Uraoka +2 more | 2001-11-27 |
| 6005401 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Shin Hashimoto, Yukiharu Uraoka +2 more | 1999-12-21 |
| 5945834 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Shin Hashimoto, Yukiharu Uraoka +2 more | 1999-08-31 |