Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7940064 | Method and apparatus for wafer level burn-in | Terutsugu Segawa | 2011-05-10 |
| 7768285 | Probe card for semiconductor IC test and method of manufacturing the same | Yoshirou Nakata | 2010-08-03 |
| 6049147 | Motor, structure of stator of the motor and assembly method of the stator | Isamu Hashimoto | 2000-04-11 |