Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10916661 | Thin film transistor substrate provided with protective film and method for producing same | Yasuaki Ishikawa, Naofumi Yoshida, Katsuto Taniguchi, Toshiaki Nonaka | 2021-02-09 |
| 10475934 | Thin film transistor, method for manufacturing same and semiconductor device comprising said thin film transistor | Haruka Yamazaki, Mami FUJII, Eiji Takahashi | 2019-11-12 |
| 9187570 | Fusion protein | Ippei INOUE, Ichiro Yamashita, Bin Zheng, Hisashi Yasueda, Yasuaki Ishikawa | 2015-11-17 |
| 7901978 | Method of fabricating thin-film transistor | Takashi Fuyuki, Hiroya Kirimura | 2011-03-08 |
| 6323663 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Shin Hashimoto +2 more | 2001-11-27 |
| 6005401 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Shin Hashimoto +2 more | 1999-12-21 |
| 5945834 | Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method | Yoshirou Nakata, Toshio Yamada, Atsushi Fujiwara, Isao Miyanaga, Shin Hashimoto +2 more | 1999-08-31 |
| 5650336 | Method of presuming life time of semiconductor device | Koji Eriguchi | 1997-07-22 |
| 5598100 | Device for and method of evaluating semiconductor integrated circuit | Toshinori Maeda | 1997-01-28 |
| 5504431 | Device for and method of evaluating semiconductor integrated circuit | Toshinori Maeda | 1996-04-02 |